Keyword : dielectric substrate measurement


Frequency Dependence Measurements of Complex Permittivity of Dielectric Plates Using TE0m1 Modes in a Circular Cavity
Hossain S. M. NAZARAT Yoshio KOBAYASHI Zhewang MA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/07/01
Vol. E93-C  No. 7 ; pp. 1126-1131
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies)
Category: 
Keyword: 
complex permittivity measurementcavity resonance methoddielectric substrate measurementfrequency dependence
 Summary | Full Text:PDF(4.9MB)

Cut-Off Circular Waveguide Method for Dielectric Substrate Measurements in Millimeter Wave Range
Takashi SHIMIZU Yoshio KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5 ; pp. 672-680
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: General Methods, Materials, and Passive Circuits
Keyword: 
cut-off circular waveguide methodmillimeter wavedielectric substrate measurement
 Summary | Full Text:PDF(1MB)

Design of a Grooved Circular Cavity for Dielectric Substrate Measurements in Millimeter Wave Region
Takashi SHIMIZU Zhewang MA Yoshio KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/08/01
Vol. E86-C  No. 8 ; pp. 1715-1720
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology)
Category: 
Keyword: 
dielectric substrate measurementcut-off circular waveguide methodmillimeter wave
 Summary | Full Text:PDF(1.1MB)