Keyword : defect detection


Thresholding Based on Maximum Weighted Object Correlation for Rail Defect Detection
Qingyong LI Yaping HUANG Zhengping LIANG Siwei LUO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/07/01
Vol. E95-D  No. 7 ; pp. 1819-1822
Type of Manuscript:  Special Section LETTER (Special Section on Machine Vision and its Applications)
Category: Image Processing
Keyword: 
automatic thresholdingdefect detectioncorrelation
 Summary | Full Text:PDF(336.3KB)

2-D Iteratively Reweighted Least Squares Lattice Algorithm and Its Application to Defect Detection in Textured Images
Ruen MEYLAN Cenker ODEN Ayn ERTUZUN Aytul ERÇL 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/05/01
Vol. E89-A  No. 5 ; pp. 1484-1494
Type of Manuscript:  PAPER
Category: Image
Keyword: 
robust least squares lattice algorithm2-D lattice filterstexture analysisdefect detection
 Summary | Full Text:PDF(1.2MB)

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 551-556
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
current testfloating gate defectopen defectdefect detection
 Summary | Full Text:PDF(459.5KB)

Automatic Evaluation of the Appearance of Seam Puckers on Suits
Tsunehiro AIBARA Takehiro MABUCHI Masanori IZUMIDA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/07/25
Vol. E83-D  No. 7 ; pp. 1346-1352
Type of Manuscript:  Special Section PAPER (Special Issue on Machine Vision Applications)
Category: 
Keyword: 
fractal dimensionseam puckerspattern recognitiondefect detectionwavelet transform
 Summary | Full Text:PDF(1.9MB)

Automatic Defect Pattern Detection on LSI Wafers Using Image Processing Techniques
Kazuyuki MARUO Tadashi SHIBATA Takahiro YAMAGUCHI Masayoshi ICHIKAWA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6 ; pp. 1003-1012
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
defect detectionimage processingimage recognitionHough transformwavelet transform
 Summary | Full Text:PDF(1.9MB)