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Keyword : critical path
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PCHECK: A Delay Analysis Tool for High Performance LSI Design Yoshio MIKI
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1996/12/20
Vol. E79-A
No. 12
pp. 2117-2122
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Keyword: delay analysis,
critical path,
device delay,
wire delay,
PCHECK,
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Full Text:PDF
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