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Keyword : concurrent error detection

Floating-Point Multiplier with Concurrent Error Detection Capability by Partial Duplication Nobutaka KITO Kazushi AKIMOTO Naofumi TAKAGI
Publication: Publication Date: 2017/03/01 Vol. E100-D No. 3 ; pp. 531-536 Type of Manuscript: PAPER Category: Dependable Computing Keyword: concurrent error detection, floating-point multiplier, duplication, truncated multiplier,
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Design for Delay Fault Testability of Dual Circuits Using Master and Slave Scan Paths Kentaroh KATOH Kazuteru NAMBA Hideo ITO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2009/03/01 Vol. E92-D No. 3 ; pp. 433-442 Type of Manuscript: PAPER Category: Dependable Computing Keyword: dual circuits, master and slave scan paths, delay fault testing, concurrent error detection, DFT,
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Concurrent Error Detection in Montgomery Multiplication over GF(2^m) Che-Wun CHIOU Chiou-Yng LEE An-Wen DENG Jim-Min LIN
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2006/02/01 Vol. E89-A No. 2 ; pp. 566-574 Type of Manuscript: PAPER Category: Information Security Keyword: cryptography, Montgomery multiplication, finite field arithmetic, fault-tolerant computing, concurrent error detection,
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On Concurrent Error Detection of Asynchronous Circuits Using Mixed-Signal Approach B. Ravi KISHORE Takashi NANYA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1997/03/25 Vol. E80-D No. 3 ; pp. 351-362 Type of Manuscript: Special Section PAPER (Special Issue on Asynchronous Circuit and System Design) Category: Completion-Detection & Checking Keyword: concurrent error detection, QDI circuits, current sensing, built-in current sensors,
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A Design Method of SFS and SCD Combinational Circuits Shin'ichi HATAKENAKA Takashi NANYA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1992/11/25 Vol. E75-D No. 6 ; pp. 819-823 Type of Manuscript: Special Section PAPER (Special Issue on Pacific Rim International Symposium on Fault Tolerant Systems) Category: Keyword: self-checking circuits, strongly fault-secure, strongly code-disjoint, combinational circuits, concurrent error detection,
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