Keyword : circuit reliability


A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology
Aibin YAN Huaguo LIANG Zhengfeng HUANG Cuiyun JIANG Maoxiang YI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/12/01
Vol. E98-C  No. 12 ; pp. 1171-1178
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
transient faultsingle event upsetsoft errorradiation hardeningcircuit reliability
 Summary | Full Text:PDF(1.7MB)

Efficient Application of Hot-Carrier Reliability Simulation to Delay Library Screening for Reliability of Logic Designs
Hisako SATO Mariko OHTSUKA Kazuya MAKABE Yuichi KONDO Kazumasa YANAGISAWA Peter M. LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/05/01
Vol. E86-C  No. 5 ; pp. 842-849
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
hot-carriercircuit reliabilitysimulationdelay librarylogic design
 Summary | Full Text:PDF(1.1MB)

A Simulation Methodology for Bidirectional Hot-Carrier Degradation in a Static RAM Circuit
Norio KOIKE Masato TAKEO Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/06/25
Vol. E81-C  No. 6 ; pp. 959-967
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
hot carrierbidirectional stressingcircuit reliabilitysimulation
 Summary | Full Text:PDF(742.9KB)

Hot-Carrier Aging Simulations of Voltage Controlled Oscillator
Norio KOIKE Hirokazu NISHIMURA Masato TAKEO Tomoyuki MORII Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/09/25
Vol. E79-C  No. 9 ; pp. 1285-1288
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
hot carriercircuit reliabilitysimulationBERT
 Summary | Full Text:PDF(343.8KB)