Keyword : capture safe test vectors


A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation
Toshinori HOSOKAWA Atsushi HIRAI Yukari YAMAUCHI Masayuki ARAI 
Publication:   
Publication Date: 2017/09/01
Vol. E100-D  No. 9 ; pp. 2118-2125
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
low powertest generationcapture safe test vectorstest vector synthesisunsafe faults
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