Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/05/01 Vol. E87-CNo. 5pp. 726-732 Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits) Category: Active Devices and Circuits Keyword: threshold voltage,
effective channel length,
channel mobility,
S-parameter,
automatic measurement,
