Keyword : X-masking


X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A  No. 12 ; pp. 3119-3127
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verfication
Keyword: 
scan testtest data compressionX-masking
 Summary | Full Text:PDF(851.7KB)

A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A  No. 12 ; pp. 3514-3523
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword: 
scan testtest data compressionX-masking
 Summary | Full Text:PDF(583.3KB)

Study on Expansion of Convolutional Compactors over Galois Field
Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 706-712
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Test Compression
Keyword: 
convolutional compactortest response compactionX-maskinggalois field
 Summary | Full Text:PDF(282.6KB)