Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C
No. 5
pp. 724-729
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category:
Keyword:
1/f noise,
flicker noise,
MOSFET,
SiON/Poly-Si Gate,
Random Telegraph Signal (RTS),
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