Keyword List
Japanese Page
SITE TOP
Login
To browse Full-Text PDF.
>
Forgotten your password?
Menu
Search
Full-Text Search
Search(JPN)
Latest Issue
A Fundamentals
Trans.Fundamentals.
JPN Edition(in Japanese)
B Communications
Trans.Commun.
JPN Edition(in Japanese)
C Electronics
Trans.Electron.
JPN Edition(in Japanese)
D Information & Systems
Trans.Inf.&Syst.
JPN Edition(in Japanese)
Abstracts of JPN Edition
Trans.Fundamentals.
Trans.Commun.
Trans.Electron.
Trans.Inf.&Syst.
Archive
Volume List
Trans.Fundamentals.
Trans.Commun.
Trans.Electron.
Trans.Inf.&Syst.
Transactions (1976-1990)
Volume List [JPN Edition]
A JPN Edition(in Japanese)
B JPN Edition(in Japanese)
C JPN Edition(in Japanese)
D JPN Edition(in Japanese)
Editorial Board & Reviewers
Open Access Papers
Trans. Commun.
Trans. Commun.(JPN Edition)
Link
Subscription
Join IEICE
Library/Nonmember
Pay Per View
A Fundamentals
B Communications
C Electronics
D Information & Systems
For Authors
IEICE Home Page
Citation Index
Privacy Policy
Copyright & Permissions
Copyright (c) by IEICE
Keyword : SRAM with logic gate
Redundancy Circuit for a Sub-nanosecond, Megabit ECL-CMOSSRAM
Kenichi OHHATA
Takeshi KUSUNOKI
Hiroaki NAMBU
Kazuo KANETANI
Toru MASUDA
Masayuki OHAYASHI
Satomi HAMAMOTO
Kunihiko YAMAGUCHI
Youji IDEI
Noriyuki HOMMA
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
1996/03/20
Vol.
E79-C
No.
3
pp.
415-423
Type of Manuscript:
PAPER
Category:
Integrated Electronics
Keyword:
redundancy
,
ECL-CMOS SRAM
,
SRAM with logic gate
,
BiCMOS
,
Summary
|
Full Text:PDF
(894.3KB)