Keyword : SICOS

Soft-Error Immune 180-µm2 SICOS Upward Transistor Memory Cell for Ultra-High-Speed High-Density Bipolar RAMs
Youji IDEI  Takeo SHIBA  Noriyuki HOMMA  Kunihiko YAMAGUCHI  Tohru NAKAMURA  Takahiro ONAI  Youichi TAMAKI  Yoshiaki SAKURAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/11/20
Vol. E75-C  No. 11  pp. 1369-1376
Type of Manuscript: Special Section PAPER (Special Issue on LSI Memories)
Category: 
Keyword: 
soft error,  SICOS,  bipolar RAM,  256 Kbit, 
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