Keyword : S-parameter measurement


A De-Embedding Method Using Different-Length Transmission Lines for mm-Wave CMOS Device Modeling
Naoki TAKAYAMA Kota MATSUSHITA Shogo ITO Ning LI Keigo BUNSEN Kenichi OKADA Akira MATSUZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/06/01
Vol. E93-C  No. 6 ; pp. 812-819
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
de-embeddingS-parameter measurementmm-waveRF CMOStransmission line
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