Keyword : MOSFET


Experimental Demonstration of Post-Fabrication Self-Improvement of SRAM Cell Stability by High-Voltage Stress
Toshiro HIRAMOTO(9522646)  The University of Tokyo;Anil KUMAR(9999999)  The University of Tokyo;Takuya SARAYA(9999999)  The University of Tokyo;Shinji MIYANO(8803927)  The Semiconductor Technology Academic Research Center (STARC) 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Vol. E96-C  No. 6  pp. 759-765
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: INVITED
Keyword: 
transistorMOSFETvariabilityoff-state stress
  Summary |  Full Text:PDF (3.5MB)

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs
Jae-Hyung JANG  Hyuk-Min KWON  Ho-Young KWAK  Sung-Kyu KWON  Seon-Man HWANG  Jong-Kwan SHIN  Seung-Yong SUNG  Yi-Sun CHUNG  Da-Soon LEE  Hi-Deok LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 624-629
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
fluorineflicker noise1/f noisereliabilityhot-carrierNBTIMOSFET
  Summary |  Full Text:PDF (2.3MB)

NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM
Nurul Ezaila ALIAS  Anil KUMAR  Takuya SARAYA  Shinji MIYANO  Toshiro HIRAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 620-623
Type of Manuscript: BRIEF PAPER
Category: 
Keyword: 
Negative Bias Temperature Instability (NBTI)variabilitySRAMtransistorMOSFET
  Summary |  Full Text:PDF (1.1MB)

Reduction of Access Resistance of InP/InGaAs Composite-Channel MOSFET with Back-Source Electrode
Atsushi KATO  Toru KANAZAWA  Shunsuke IKEDA  Yoshiharu YONAI  Yasuyuki MIYAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C  No. 5  pp. 904-909
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
back-sourceMOSFETInGaAsBCBbonding
  Summary |  Full Text:PDF (1.8MB)

A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior
Raul FERNANDEZ-GARCIA  Ignacio GIL  Alexandre BOYER  Sonia BENDHIA  Bertrand VRIGNON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/12/01
Vol. E94-C  No. 12  pp. 1906-1908
Type of Manuscript: BRIEF PAPER
Category: Electronic Circuits
Keyword: 
MOSFETelectromagnetic compatibility (EMC)electrical modellingdirect power injection
  Summary |  Full Text:PDF (356.9KB)

Analytical Drain Current Modeling of Dual-Material Surrounding-Gate MOSFETs
Zunchao LI  Jinpeng XU  Linlin LIU  Feng LIANG  Kuizhi MEI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6  pp. 1120-1126
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsurrounding-gatedual-materialhalo
  Summary |  Full Text:PDF (558.6KB)

Evaluation of 1/f Noise Characteristics in High-k/Metal Gate and SiON/Poly-Si Gate MOSFET with 65 nm CMOS Process
Takuya IMAMOTO  Takeshi SASAKI  Tetsuo ENDOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C  No. 5  pp. 724-729
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
1/f noiseflicker noiseMOSFETSiON/Poly-Si GateRandom Telegraph Signal (RTS)
  Summary |  Full Text:PDF (2.3MB)

Device Modeling Techniques for High-Frequency Circuits Design Using Bond-Based Design at over 100 GHz
Ryuichi FUJIMOTO  Kyoya TAKANO  Mizuki MOTOYOSHI  Uroschanit YODPRASIT  Minoru FUJISHIMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4  pp. 589-597
Type of Manuscript: Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
millimeter wavedevice modelMOSFETtransmission linepadbond-based design
  Summary |  Full Text:PDF (2MB)

A High PSRR Bandgap Voltage Reference with Virtually Diode-Connected MOS Transistors
Kianoush SOURI  Hossein SHAMSI  Mehrshad KAZEMI  Kamran SOURI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/12/01
Vol. E93-C  No. 12  pp. 1708-1712
Type of Manuscript: BRIEF PAPER
Category: Electronic Circuits
Keyword: 
bandgapreference voltageweak inversionMOSFET
  Summary |  Full Text:PDF (638.1KB)

Analyzing the On-State Power Dissipation in Stepped-Output Diode-Clamped Multi-Level Inverter
Ehsan ESFANDIARI  Norman Bin MARIUN  Mohammad Hamiruce MARHABAN  Azmi ZAKARIA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/12/01
Vol. E93-C  No. 12  pp. 1670-1678
Type of Manuscript: PAPER
Category: Electronic Circuits
Keyword: 
diode-clampedmulti-level inverteron-stateMOSFETpower dissipation
  Summary |  Full Text:PDF (1.2MB)

Sub-10 nm Multi-Nano-Pillar Type Vertical MOSFET
Tetsuo ENDOH  Koji SAKUI  Yukio YASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 557-562
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Emerging Devices
Keyword: 
vertical MOSFET3D structured deviceMOSFETLSI
  Summary |  Full Text:PDF (7.8MB)

Design of 30 nm FinFETs and Double Gate MOSFETs with Halo Structure
Tetsuo ENDOH  Koji SAKUI  Yukio YASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 534-539
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Multi-Gate Technology
Keyword: 
FinFEThalo I/IMOSFETthreshold voltage roll-offS-factor
  Summary |  Full Text:PDF (3.6MB)

Analytical and Numerical Study of the Impact of Halos on Surrounding-Gate MOSFETs
Zunchao LI  Ruizhi ZHANG  Feng LIANG  Zhiyong YANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 558-563
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsurrounding-gatecompact modelhalo
  Summary |  Full Text:PDF (415.4KB)

Stress Effect Analysis for PD SOI pMOSFETs with Undoped-Si0.88Ge0.12 Heterostructure Channel
Sang-Sik CHOI  A-Ram CHOI  Jae-Yeon KIM  Jeon-Wook YANG  Yong-Woo HWANG  Tae-Hyun HAN  Deok Ho CHO  Kyu-Hwan SHIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 716-720
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
SiGeMOSFETPD SOIstress effect
  Summary |  Full Text:PDF (705.9KB)

FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs
Hochul LEE  Youngchang YOON  Ickhyun SONG  Hyungcheol SHIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 776-779
Type of Manuscript: Special Section LETTER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
random telegraph signal noiseFN stressflash memoryMOSFET
  Summary |  Full Text:PDF (661.2KB)

Monolithic Integration of III-V Active Devices into Silicon Platform for Optoelectronic Integrated Circuits
Yuzo FURUKAWA  Hiroo YONEZU  Akihiro WAKAHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/02/01
Vol. E91-C  No. 2  pp. 145-149
Type of Manuscript: Special Section PAPER (Special Section on Silicon Photonics Technologies and Their Applications)
Category: INVITED
Keyword: 
SiIII-V-N alloyslight emitting diodeMOSFETmonolithic-integration
  Summary |  Full Text:PDF (935.2KB)

Transfer and Detection of Single Electrons Using Metal-Oxide-Semiconductor Field-Effect Transistors
Wancheng ZHANG  Katsuhiko NISHIGUCHI  Yukinori ONO  Akira FUJIWARA  Hiroshi YAMAGUCHI  Hiroshi INOKAWA  Yasuo TAKAHASHI  Nan-Jian WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/05/01
Vol. E90-C  No. 5  pp. 943-948
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Emerging Devices
Keyword: 
single-electronMOSFETturnstilesingle-electron detection
  Summary |  Full Text:PDF (790.5KB)

Gate-Extension Overlap Control by Sb Tilt Implantation
Kentaro SHIBAHARA  Nobuhide MAEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/05/01
Vol. E90-C  No. 5  pp. 973-977
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Junction Formation and TFT Reliability
Keyword: 
MOSFETextensiongateoverlaptilt implantationSb
  Summary |  Full Text:PDF (533.7KB)

Shot Noise Modeling in Metal-Oxide-Semiconductor Field Effect Transistors under Sub-Threshold Condition
Yoshioki ISOBE  Kiyohito HARA  Dondee NAVARRO  Youichi TAKEDA  Tatsuya EZAKI  Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C  No. 4  pp. 885-894
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETshot noisehigh frequency noisedevice simulationsub-threshold current
  Summary |  Full Text:PDF (713.2KB)

Accurate Small-Signal Modeling of FD-SOI MOSFETs
Guechol KIM  Yoshiyuki SHIMIZU  Bunsei MURAKAMI  Masaru GOTO  Keisuke UEDA  Takao KIHARA  Toshimasa MATSUOKA  Kenji TANIGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/04/01
Vol. E89-C  No. 4  pp. 517-519
Type of Manuscript: Special Section LETTER (Special Section on Advanced RF Technologies for Compact Wireless Equipment and Mobile Phones)
Category: 
Keyword: 
FD-SOIMOSFETRFmodelingnon-quasi-static
  Summary |  Full Text:PDF (238.4KB)

On the Computational Synthesis of CMOS Voltage Followers
Esteban TLELO-CUAUTLE  Delia TORRES-MUÑOZ  Leticia TORRES-PAPAQUI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Vol. E88-A  No. 12  pp. 3479-3484
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Circuit Synthesis
Keyword: 
CADanalog synthesisvoltage followernullatornoratorbiasing and sizingMOSFET
  Summary |  Full Text:PDF (326.5KB)

The Influence of the Stacked and Double Material Gate Structures on the Short Channel Effects in SOI MOSFETS
Ehsanollah FATHI  Ashkan BEHNAM  Pouya HASHEMI  Behzad ESFANDYARPOUR  Morteza FATHIPOUR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/06/01
Vol. E88-C  No. 6  pp. 1122-1126
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: Device
Keyword: 
MOSFETdual metal gatestacked gateDIBLshort channel effects
  Summary |  Full Text:PDF (660.9KB)

Characterization and Modeling of Gate-Induced-Drain-Leakage
Fabien GILIBERT  Denis RIDEAU  Alexandre DRAY  Francois AGUT  Michel MINONDO  Andre JUGE  Pascal MASSON  Rachid BOUCHAKOUR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 829-837
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
GIDLcompact modelMOSFETelectric fieldtrap assisted tunneling
  Summary |  Full Text:PDF (1.6MB)

RFCV Test Structure Design for a Selected Frequency Range
Wutthinan JEAMSAKSIRI  Abdelkarim MERCHA  Javier RAMOS  Stefaan DECOUTERE  Florence CUBAYNES 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 817-823
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
capacitanceCVgate dielectricimpedanceMOSFETnitrideoxideRFS-parameters
  Summary |  Full Text:PDF (882.7KB)

A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission
Toshihiro MATSUDA  Hiroaki TAKEUCHI  Akira MURAMATSU  Hideyuki IWATA  Takashi OHZONE  Kyoji YAMASHITA  Norio KOIKE  Ken-ichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 811-816
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
MOSFETphotoemissionhot carriergate length
  Summary |  Full Text:PDF (1.1MB)

Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs
Takeo MATSUKI  Kazuyoshi TORII  Takeshi MAEDA  Yasushi AKASAKA  Kiyoshi HAYASHI  Naoki KASAI  Tsunetoshi ARIKADO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 804-810
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
MOSFEThigh-kmetal-gategate-last
  Summary |  Full Text:PDF (858.2KB)

Separation by Bonding Si Islands (SBSI) for Advanced CMOS LSI Applications
Takashi YAMAZAKI  Shun-ichiro OHMI  Shinya MORITA  Hiroyuki OHRI  Junichi MUROTA  Masao SAKURABA  Hiroo OMI  Tetsushi SAKAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4  pp. 656-661
Type of Manuscript: Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Si Devices and Processes
Keyword: 
silicon on insulator (SOI) waferpatterned SOISiGeselective etchingMOSFET
  Summary |  Full Text:PDF (1.3MB)

Equivalent Saturated MOSFET Circuit with Wide Input Range
Takahide SATO  Shigetaka TAKAGI  Nobuo FUJII 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/02/01
Vol. E88-A  No. 2  pp. 431-437
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
MOSFETsaturation regionequivalent MOSFET circuit
  Summary |  Full Text:PDF (434.3KB)

Gate-to-Bulk Overlap Capacitance Extraction and Its Circuit Verification
Masanori SHIMASUE  Yasuo KAWAHARA  Takeshi SANO  Hitoshi AOKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/06/01
Vol. E87-C  No. 6  pp. 929-932
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: 
Keyword: 
CGBOmodelingextractionMOSFETsimulation
  Summary |  Full Text:PDF (659.5KB)

Compact CMOS Modelling for Advanced Analogue and RF Applications
Dirk B.M. KLAASSEN  Ronald van LANGEVELDE  Andries J. SCHOLTEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/06/01
Vol. E87-C  No. 6  pp. 854-866
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: INVITED
Keyword: 
compact modellingcompact modelsMOSFETRF performanceanalogue applicationsRF applicationsR2R circuitvariable transconductance circuit
  Summary |  Full Text:PDF (1.4MB)

Mobility Reduction Cancellation Technique for OTA Using MOSFETs Operated in Triode and Saturation Regions
Hayato FUJII  Akira HYOGO  Keitaro SEKINE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/06/01
Vol. E87-C  No. 6  pp. 990-995
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: 
Keyword: 
MOSFETOTAmobility reductiontriode regionsaturation region
  Summary |  Full Text:PDF (988.7KB)

A 380-MHz CMOS Linear-in-dB Variable Gain Amplifier with Gain Compensation Techniques for CDMA Systems
Osamu WATANABE  Mitsuyuki ASHIDA  Tetsuro ITAKURA  Shoji OTAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/06/01
Vol. E86-C  No. 6  pp. 1069-1076
Type of Manuscript: Special Section PAPER (Special Issue on Devices and Circuits for Next Generation Multi-Media Communication Systems)
Category: 
Keyword: 
variable gain amplifierVGAgain compensationtemperature compensationlinear-in-dB characteristicssquare circuitMOSFETsquare-law regionexponential-law regionCDMA
  Summary |  Full Text:PDF (590.5KB)

Ensemble Monte Carlo/Molecular Dynamics Simulation of Inversion Layer Mobility in Si MOSFETs--Effects of Substrate Impurity
Yoshinari KAMAKURA  Hironori RYOUKE  Kenji TANIGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3  pp. 357-362
Type of Manuscript: Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category: 
Keyword: 
Monte Carlo simulationmolecular dynamicsmobilityscreeningMOSFET
  Summary |  Full Text:PDF (1.4MB)

A Study of a Stable Driving Circuit for Arbitrary-Shaped Electroluminescent Elements
Yasuyuki KITADA  Noboru MASUDA  Hiroshi NAKANE  Sadao YAMAZAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/02/01
Vol. E86-A  No. 2  pp. 404-410
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
electroluminescent (EL) devicedriving circuitMOSFETtransformer
  Summary |  Full Text:PDF (719.8KB)

Simulations of High-Frequency Thermal Noise in Silicon-on-Insulator MOSFETs Using Distributed-Transmission-Line Model
Daijiro SUMINO  Yasuhisa OMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/07/01
Vol. E85-C  No. 7  pp. 1443-1450
Type of Manuscript: Special Section PAPER (Special Issue on Silicon RF Device & Integrated Circuit Technologies)
Category: 
Keyword: 
thermal noisesilicon-on-insulatorMOSFETtransmission-line model
  Summary |  Full Text:PDF (849KB)

Design and Simulation of 4Q-Multiplier Using Linear and Saturation Regions of MOSFET Complementally
Tsutomu SUZUKI  Takao OURA  Teru YONEYAMA  Hideki ASAI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/06/01
Vol. E85-A  No. 6  pp. 1242-1248
Type of Manuscript: Special Section PAPER (Special Section on Papers Selected from 2001 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2001))
Category: 
Keyword: 
4Q-MultiplierMOSFETlinear regionsaturation regionanalog circuit
  Summary |  Full Text:PDF (644.2KB)

A New Test Structure for Precise Location Measurement of Hot-Carrier-Induced Photoemission Peak in Subquarter-Micron MOSFETs
Toshihiro MATSUDA  Mari FUNADA  Takashi OHZONE  Etsumasa KAMEDA  Shinji ODANAKA  Kyoji TAMASHITA  Norio KOIKE  Ken-ichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5  pp. 1125-1133
Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
test structureMOSFEThot carrierphotoemission
  Summary |  Full Text:PDF (1.8MB)

Operational Transconductance Amplifier with Rail-to-Rail Input Stage Using Single Channel Type MOSFETs
Takahide SATO  Shigetaka TAKAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/02/01
Vol. E85-A  No. 2  pp. 354-359
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
rail-to-rail operationOTAMOSFEToperation region
  Summary |  Full Text:PDF (338.2KB)

Power Consumption of Hybrid Circuits of Single-Electron Transistors and Complementary Metal-Oxide-Semiconductor Field-Effect Transistors
Ken UCHIDA  Junji KOGA  Ryuji OHBA  Akira TORIUMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/08/01
Vol. E84-C  No. 8  pp. 1066-1070
Type of Manuscript: Special Section PAPER (Special Issue on Silicon Nanodevices)
Category: 
Keyword: 
single-electrontunnelingMOSFETpower
  Summary |  Full Text:PDF (719.9KB)

Scaling Limit of the MOS Transistor--A Ballistic MOSFET--
Kenji NATORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/08/01
Vol. E84-C  No. 8  pp. 1029-1036
Type of Manuscript: INVITED PAPER (Special Issue on Silicon Nanodevices)
Category: 
Keyword: 
ballistic MOSFETscaling limitcurrent-voltage characteristicsMOSFETinjection velocity
  Summary |  Full Text:PDF (442.2KB)

MOSFET Instantaneous Companding Integrator
Nobukazu TAKAI  Ken-ichi TAKANO  Shigetaka TAKAGI  Nobuo FUJII 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/02/01
Vol. E84-A  No. 2  pp. 545-551
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques Supporting the System LSI Era)
Category: 
Keyword: 
MOSFETcompanding circuitintegrator
  Summary |  Full Text:PDF (592.4KB)

Statistical Modeling of Device Characteristics with Systematic Variability
Kenichi OKADA  Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/02/01
Vol. E84-A  No. 2  pp. 529-536
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques Supporting the System LSI Era)
Category: 
Keyword: 
MOSFETvariabilitysystematicstochastic
  Summary |  Full Text:PDF (327.3KB)

Low Power and Low Voltage MOSFETs with Variable Threshold Voltage Controlled by Back-Bias
Toshiro HIRAMOTO  Makoto TAKAMIYA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/02/20
Vol. E83-C  No. 2  pp. 161-169
Type of Manuscript: INVITED PAPER (Special Issue on Low-Power High-Speed CMOS LSI Technologies)
Category: 
Keyword: 
MOSFETlow powerlow voltagevariable threshold voltageback-biasbody effectDTMOSSOI
  Summary |  Full Text:PDF (890.6KB)

Worst/Best Device and Circuit Performances for MOSFETs Determined from Process Fluctuations
Odin PRIGGE  Masami SUETAKE  Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/20
Vol. E82-C  No. 6  pp. 997-1002
Type of Manuscript: Special Section PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
MOSFETperformance distribution 2σanalytical model
  Summary |  Full Text:PDF (741.8KB)

Inverse Modeling and Its Application to MOSFET Channel Profile Extraction
Hirokazu HAYASHI  Hideaki MATSUHASHI  Koichi FUKUDA  Kenji NISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/20
Vol. E82-C  No. 6  pp. 862-869
Type of Manuscript: INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
inverse modelingdoping profile extractionMOSFETthreshold voltage
  Summary |  Full Text:PDF (952.4KB)

A Study on Hot-Carrier-Induced Photoemission in n-MOSFETs
Toshihiro MATSUDA  Naoko MATSUYAMA  Kiyomi HOSOI  Etsumasa KAMEDA  Takashi OHZONE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/20
Vol. E82-C  No. 4  pp. 593-601
Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
MOSFEThot carriersphotoemissionjunction breakdown
  Summary |  Full Text:PDF (530.5KB)

A Study of Electrical Characteristics Improvements in Sub-0.1 µm Gate Length MOSFETs by Low Temperature Operation
Morikazu TSUNO  Shin YOKOYAMA  Kentaro SHIBAHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/12/20
Vol. E81-C  No. 12  pp. 1913-1917
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETlow temperaturevelocity overshootSbnonsteady-stationary effectimpact ionizationhot-carrier
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Simulated Device Design Optimization to Reduce the Floating Body Effect for Sub-Quarter Micron Fully Depleted SOI-MOSFETs
Risho KOH  Tohru MOGAMI  Haruo KATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/07/20
Vol. E80-C  No. 7  pp. 893-898
Type of Manuscript: Special Section PAPER (Special Issue on New Concept Device and Novel Architecture LSIs)
Category: Novel Structure Devices
Keyword: 
SOIMOSFETfloating body effectsimulationapplicable voltage
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Large-Signal Analysis of Power MOSFETs and Its Application to Device Design
Noriaki MATSUNO  Hitoshi YANO  Yasuyuki SUZUKI  Toshiaki INOUE  Tetsu TODA  Yasushi KOSE  Yoichiro TAKAYAMA  Kazuhiko HONJO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/06/20
Vol. E80-C  No. 6  pp. 734-739
Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeterwave High-power Devices)
Category: 
Keyword: 
power deviceMOSFETlarge-signal simulationcellular telephone
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Features of Ultimately Miniaturized MOSFETs/SOI: A New Stage in Device Physics and Design Concepts
Yasuhisa OMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/03/20
Vol. E80-C  No. 3  pp. 394-406
Type of Manuscript: INVITED PAPER (Special Issue on SOI Devices and Their Process Technologies)
Category: Device and Process Technologies
Keyword: 
SOISIMOXMOSFETdown-scalingultra-thin
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L-Band SPDT Switch Using Si-MOSFET
Yoshitada IYAMA  Noriharu SUEMATSU  Tomonori SHIGEMATSU  Takao MORIWAKI  Tatsuhiko IKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/05/20
Vol. E79-C  No. 5  pp. 636-643
Type of Manuscript: Special Section PAPER (Special Issue on Microwave Devices for Mobile Communications)
Category: Active Devices
Keyword: 
switchmicrowaveSiMOSFETcommunication
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Effects of Field Edge Steps on Electrical Gate Linewidth Measurements
Naoki KASAI  Ichiro YAMAMOTO  Koji URABE  Kuniaki KOYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/20
Vol. E79-C  No. 2  pp. 152-157
Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
test structureMOSFETlinewidthfield step
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Electrical Characteristics of n- and p-MOSFETs with Gates Crossing Source/Drain Regions at 90and 45
Takashi OHZONE  Naoko MATSUYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/20
Vol. E79-C  No. 2  pp. 172-178
Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
MOSFETelectrical characteristics45 CMOSFET
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High-Speed and Low-Power n+-p+ Double-Gate SOI CMOS
Kunihiro SUZUKI  Tetsu TANAKA  Yoshiharu TOSAKA  Hiroshi HORIE  Toshihiro SUGII 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/04/20
Vol. E78-C  No. 4  pp. 360-367
Type of Manuscript: Special Section PAPER (Special Issue on Low-Voltage, Low-Power Integrated Circuits)
Category: Device Technology
Keyword: 
MOSFETSOIdouble-gatehigh-speedlow-powerthreshold voltage
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A New Wide Applicable Mobility Model for Device Simulation Taking Physics-Based Carrier Screening Effects into Account
Koichi FUKUDA  Kenji NISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/20
Vol. E78-C  No. 3  pp. 281-287
Type of Manuscript: Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category: 
Keyword: 
device simulationmobilitycarrier screeningimpurity scatteringMOSFET
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Plasma-Induced Transconductance Degradation of nMOSFET with Thin Gate Oxide
Koji ERIGUCHI  Masatoshi ARAI  Yukiharu URAOKA  Masafumi KUBOTA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/20
Vol. E78-C  No. 3  pp. 261-266
Type of Manuscript: Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category: 
Keyword: 
MOSFETtransconductanceSi-SiO2 interface statecharge-to-breakdownantenna effect
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A Novel Effective-Channel-Length/External-Resistance Extraction Method for Small-Geometry MOSFET's
Takaaki YAGI  You-Wen YI  Mitsuchika SAITOH  Nobuo MIKOSHIBA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/12/20
Vol. E77-C  No. 12  pp. 1966-1969
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETeffective channel lengthsource-drain resistancelocal Vth
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Deep Submicron Field Isolation with Buried Insulator between Polysilicon Electrodes (BIPS)
Masahiro SHIMIZU  Masahide INUISHI  Katsuhiro TSUKAMOTO  Hideaki ARIMA  Hirokazu MIYOSHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/20
Vol. E77-C  No. 8  pp. 1369-1376
Type of Manuscript: Special Section PAPER (Special Section on High Speed and High Density Multi Functional LSI Memories)
Category: General Technology
Keyword: 
isolationparasitic field transistorMOSFET
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C-V and I-V Characteristics of a MOSFET with Si-Implanted Gate-SiO2
Takashi OHZONE  Takashi HORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/06/20
Vol. E77-C  No. 6  pp. 952-959
Type of Manuscript: PAPER
Category: Integrated Electronics
Keyword: 
MOSFETSi-implantationEEPROM
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LATID (Large-Angle-Tilt Implanted Drain) FETs with Buried n- Profile for Deep-Submicron ULSIs
Junji HIRASE  Takashi HORI  Yoshinori ODAKE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/20
Vol. E77-C  No. 3  pp. 350-354
Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
MOSFETLDDn--gate overlapcircuit speedhot-carrier-induced degradation
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Bi-MOSFET Amplifier for Integration with Multimicroelectrode Array for Extracellular Neuronal Recording
Kohro TAKAHASHI  Satoshi TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/02/20
Vol. E77-A  No. 2  pp. 388-393
Type of Manuscript: Special Section PAPER (Special Section on High-Performance MOS Analog Circuits)
Category: 
Keyword: 
MOSFET1/f noisemicroelectrodeextracellular recordinglow noise amplifier
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Two-Dimensional Modeling of Self-Aligned Silicide Processes with the General-Purpose Process Simulator OPUS
Kazuhiko KAI  Shigeki KURODA  Kenji NISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/20
Vol. E77-C  No. 2  pp. 129-133
Type of Manuscript: Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Process Simulation
Keyword: 
process simulationmodel for silicide growthSALICIDEsilicidationtitanium disilicideMOSFET
  Summary |  Full Text:PDF (402.3KB)

Process and Device Technologies of CMOS Devices for Low-Voltage Operation
Masakazu KAKUMU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/05/20
Vol. E76-C  No. 5  pp. 672-680
Type of Manuscript: INVITED PAPER (Special Section on Low-Power and Low-Voltage Integrated Circuits)
Category: 
Keyword: 
CMOSSOISIMOXMOSFETlow-voltagelow-temperaturethreshold voltage high-speedpower-supply voltagesubthreshold currentcircuit performancepower dissipation
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Effects of Synchrotron X-Ray Irradiation on Hot Carrier Reliability in Subquarter-Micrometer NMOSFETs
Toshiaki TSUCHIYA  Mitsuru HARADA  Kimiyoshi DEGUCHI  Tadahito MATSUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/20
Vol. E76-C  No. 4  pp. 506-510
Type of Manuscript: INVITED PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
MOSFETreliabilityhot carriersynchrotron X-ray
  Summary |  Full Text:PDF (474.6KB)

Multi-Step Function MOS Transistor Circuits
Shinji KARASAWA  Kazuhiko YAMANOUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/03/20
Vol. E76-C  No. 3  pp. 357-363
Type of Manuscript: INVITED PAPER (Special Issue on Multiple-Valued Integrated Circuits)
Category: 
Keyword: 
MOSFETpunch-through effectquantizing circuitmultiple-valued flip-flop
  Summary |  Full Text:PDF (544KB)

Small-Signal High Frequency MOSFET Model Considering Two-Field-Dependent Mobility Effect
Laredj BELABAS  Nobuo FUJII  Shigetaka TAKAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/02/20
Vol. E76-A  No. 2  pp. 193-203
Type of Manuscript: Special Section PAPER (Special Section on High-Speed Analog Circuits and Signal Processing)
Category: 
Keyword: 
MOSFEThigh frequency modelmobility
  Summary |  Full Text:PDF (637.3KB)

Effects of Hot Electron Trapping in Ultra-Thin-Film SOI/SIMOX pMOSFET's
Kazuo SUKEGAWA  Seiichiro KAWAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/12/20
Vol. E75-C  No. 12  pp. 1484-1490
Type of Manuscript: Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices)
Category: Hot Carrier
Keyword: 
SIMOXMOSFEThot carrier effectelectron trapping
  Summary |  Full Text:PDF (576.9KB)