Keyword : MOSFET


NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM
Nurul Ezaila ALIAS  Anil KUMAR  Takuya SARAYA  Shinji MIYANO  Toshiro HIRAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 620-623
Type of Manuscript: BRIEF PAPER
Category: 
Keyword: 
Negative Bias Temperature Instability (NBTI)variabilitySRAMtransistorMOSFET
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Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs
Jae-Hyung JANG  Hyuk-Min KWON  Ho-Young KWAK  Sung-Kyu KWON  Seon-Man HWANG  Jong-Kwan SHIN  Seung-Yong SUNG  Yi-Sun CHUNG  Da-Soon LEE  Hi-Deok LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 624-629
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
fluorineflicker noise1/f noisereliabilityhot-carrierNBTIMOSFET
  Summary |  Full Text:PDF

Reduction of Access Resistance of InP/InGaAs Composite-Channel MOSFET with Back-Source Electrode
Atsushi KATO  Toru KANAZAWA  Shunsuke IKEDA  Yoshiharu YONAI  Yasuyuki MIYAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C  No. 5  pp. 904-909
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
back-sourceMOSFETInGaAsBCBbonding
  Summary |  Full Text:PDF

A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior
Raul FERNANDEZ-GARCIA  Ignacio GIL  Alexandre BOYER  Sonia BENDHIA  Bertrand VRIGNON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/12/01
Vol. E94-C  No. 12  pp. 1906-1908
Type of Manuscript: BRIEF PAPER
Category: Electronic Circuits
Keyword: 
MOSFETelectromagnetic compatibility (EMC)electrical modellingdirect power injection
  Summary |  Full Text:PDF

Analytical Drain Current Modeling of Dual-Material Surrounding-Gate MOSFETs
Zunchao LI  Jinpeng XU  Linlin LIU  Feng LIANG  Kuizhi MEI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6  pp. 1120-1126
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsurrounding-gatedual-materialhalo
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Evaluation of 1/f Noise Characteristics in High-k/Metal Gate and SiON/Poly-Si Gate MOSFET with 65 nm CMOS Process
Takuya IMAMOTO  Takeshi SASAKI  Tetsuo ENDOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C  No. 5  pp. 724-729
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
1/f noiseflicker noiseMOSFETSiON/Poly-Si GateRandom Telegraph Signal (RTS)
  Summary |  Full Text:PDF

Device Modeling Techniques for High-Frequency Circuits Design Using Bond-Based Design at over 100 GHz
Ryuichi FUJIMOTO  Kyoya TAKANO  Mizuki MOTOYOSHI  Uroschanit YODPRASIT  Minoru FUJISHIMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4  pp. 589-597
Type of Manuscript: Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
millimeter wavedevice modelMOSFETtransmission linepadbond-based design
  Summary |  Full Text:PDF

A High PSRR Bandgap Voltage Reference with Virtually Diode-Connected MOS Transistors
Kianoush SOURI  Hossein SHAMSI  Mehrshad KAZEMI  Kamran SOURI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/12/01
Vol. E93-C  No. 12  pp. 1708-1712
Type of Manuscript: BRIEF PAPER
Category: Electronic Circuits
Keyword: 
bandgapreference voltageweak inversionMOSFET
  Summary |  Full Text:PDF

Analyzing the On-State Power Dissipation in Stepped-Output Diode-Clamped Multi-Level Inverter
Ehsan ESFANDIARI  Norman Bin MARIUN  Mohammad Hamiruce MARHABAN  Azmi ZAKARIA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/12/01
Vol. E93-C  No. 12  pp. 1670-1678
Type of Manuscript: PAPER
Category: Electronic Circuits
Keyword: 
diode-clampedmulti-level inverteron-stateMOSFETpower dissipation
  Summary |  Full Text:PDF

Sub-10 nm Multi-Nano-Pillar Type Vertical MOSFET
Tetsuo ENDOH  Koji SAKUI  Yukio YASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 557-562
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Emerging Devices
Keyword: 
vertical MOSFET3D structured deviceMOSFETLSI
  Summary |  Full Text:PDF

Design of 30 nm FinFETs and Double Gate MOSFETs with Halo Structure
Tetsuo ENDOH  Koji SAKUI  Yukio YASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 534-539
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Multi-Gate Technology
Keyword: 
FinFEThalo I/IMOSFETthreshold voltage roll-offS-factor
  Summary |  Full Text:PDF

Analytical and Numerical Study of the Impact of Halos on Surrounding-Gate MOSFETs
Zunchao LI  Ruizhi ZHANG  Feng LIANG  Zhiyong YANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 558-563
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsurrounding-gatecompact modelhalo
  Summary |  Full Text:PDF

Stress Effect Analysis for PD SOI pMOSFETs with Undoped-Si0.88Ge0.12 Heterostructure Channel
Sang-Sik CHOI  A-Ram CHOI  Jae-Yeon KIM  Jeon-Wook YANG  Yong-Woo HWANG  Tae-Hyun HAN  Deok Ho CHO  Kyu-Hwan SHIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 716-720
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
SiGeMOSFETPD SOIstress effect
  Summary |  Full Text:PDF

FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs
Hochul LEE  Youngchang YOON  Ickhyun SONG  Hyungcheol SHIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 776-779
Type of Manuscript: Special Section LETTER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
random telegraph signal noiseFN stressflash memoryMOSFET
  Summary |  Full Text:PDF

Monolithic Integration of III-V Active Devices into Silicon Platform for Optoelectronic Integrated Circuits
Yuzo FURUKAWA  Hiroo YONEZU  Akihiro WAKAHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/02/01
Vol. E91-C  No. 2  pp. 145-149
Type of Manuscript: Special Section PAPER (Special Section on Silicon Photonics Technologies and Their Applications)
Category: INVITED
Keyword: 
SiIII-V-N alloyslight emitting diodeMOSFETmonolithic-integration
  Summary |  Full Text:PDF

Transfer and Detection of Single Electrons Using Metal-Oxide-Semiconductor Field-Effect Transistors
Wancheng ZHANG  Katsuhiko NISHIGUCHI  Yukinori ONO  Akira FUJIWARA  Hiroshi YAMAGUCHI  Hiroshi INOKAWA  Yasuo TAKAHASHI  Nan-Jian WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/05/01
Vol. E90-C  No. 5  pp. 943-948
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Emerging Devices
Keyword: 
single-electronMOSFETturnstilesingle-electron detection
  Summary |  Full Text:PDF

Gate-Extension Overlap Control by Sb Tilt Implantation
Kentaro SHIBAHARA  Nobuhide MAEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/05/01
Vol. E90-C  No. 5  pp. 973-977
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Junction Formation and TFT Reliability
Keyword: 
MOSFETextensiongateoverlaptilt implantationSb
  Summary |  Full Text:PDF

Shot Noise Modeling in Metal-Oxide-Semiconductor Field Effect Transistors under Sub-Threshold Condition
Yoshioki ISOBE  Kiyohito HARA  Dondee NAVARRO  Youichi TAKEDA  Tatsuya EZAKI  Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C  No. 4  pp. 885-894
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETshot noisehigh frequency noisedevice simulationsub-threshold current
  Summary |  Full Text:PDF

Accurate Small-Signal Modeling of FD-SOI MOSFETs
Guechol KIM  Yoshiyuki SHIMIZU  Bunsei MURAKAMI  Masaru GOTO  Keisuke UEDA  Takao KIHARA  Toshimasa MATSUOKA  Kenji TANIGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/04/01
Vol. E89-C  No. 4  pp. 517-519
Type of Manuscript: Special Section LETTER (Special Section on Advanced RF Technologies for Compact Wireless Equipment and Mobile Phones)
Category: 
Keyword: 
FD-SOIMOSFETRFmodelingnon-quasi-static
  Summary |  Full Text:PDF

On the Computational Synthesis of CMOS Voltage Followers
Esteban TLELO-CUAUTLE  Delia TORRES-MUÑOZ  Leticia TORRES-PAPAQUI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Vol. E88-A  No. 12  pp. 3479-3484
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Circuit Synthesis
Keyword: 
CADanalog synthesisvoltage followernullatornoratorbiasing and sizingMOSFET
  Summary |  Full Text:PDF

The Influence of the Stacked and Double Material Gate Structures on the Short Channel Effects in SOI MOSFETS
Ehsanollah FATHI  Ashkan BEHNAM  Pouya HASHEMI  Behzad ESFANDYARPOUR  Morteza FATHIPOUR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/06/01
Vol. E88-C  No. 6  pp. 1122-1126
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: Device
Keyword: 
MOSFETdual metal gatestacked gateDIBLshort channel effects
  Summary |  Full Text:PDF

Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs
Takeo MATSUKI  Kazuyoshi TORII  Takeshi MAEDA  Yasushi AKASAKA  Kiyoshi HAYASHI  Naoki KASAI  Tsunetoshi ARIKADO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 804-810
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
MOSFEThigh-kmetal-gategate-last
  Summary |  Full Text:PDF

A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission
Toshihiro MATSUDA  Hiroaki TAKEUCHI  Akira MURAMATSU  Hideyuki IWATA  Takashi OHZONE  Kyoji YAMASHITA  Norio KOIKE  Ken-ichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 811-816
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
MOSFETphotoemissionhot carriergate length
  Summary |  Full Text:PDF

RFCV Test Structure Design for a Selected Frequency Range
Wutthinan JEAMSAKSIRI  Abdelkarim MERCHA  Javier RAMOS  Stefaan DECOUTERE  Florence CUBAYNES 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 817-823
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
capacitanceCVgate dielectricimpedanceMOSFETnitrideoxideRFS-parameters
  Summary |  Full Text:PDF

Characterization and Modeling of Gate-Induced-Drain-Leakage
Fabien GILIBERT  Denis RIDEAU  Alexandre DRAY  Francois AGUT  Michel MINONDO  Andre JUGE  Pascal MASSON  Rachid BOUCHAKOUR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 829-837
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
GIDLcompact modelMOSFETelectric fieldtrap assisted tunneling
  Summary |  Full Text:PDF

Separation by Bonding Si Islands (SBSI) for Advanced CMOS LSI Applications
Takashi YAMAZAKI  Shun-ichiro OHMI  Shinya MORITA  Hiroyuki OHRI  Junichi MUROTA  Masao SAKURABA  Hiroo OMI  Tetsushi SAKAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4  pp. 656-661
Type of Manuscript: Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Si Devices and Processes
Keyword: 
silicon on insulator (SOI) waferpatterned SOISiGeselective etchingMOSFET
  Summary |  Full Text:PDF

Equivalent Saturated MOSFET Circuit with Wide Input Range
Takahide SATO  Shigetaka TAKAGI  Nobuo FUJII 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/02/01
Vol. E88-A  No. 2  pp. 431-437
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
MOSFETsaturation regionequivalent MOSFET circuit
  Summary |  Full Text:PDF

Gate-to-Bulk Overlap Capacitance Extraction and Its Circuit Verification
Masanori SHIMASUE  Yasuo KAWAHARA  Takeshi SANO  Hitoshi AOKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/06/01
Vol. E87-C  No. 6  pp. 929-932
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: 
Keyword: 
CGBOmodelingextractionMOSFETsimulation
  Summary |  Full Text:PDF

Compact CMOS Modelling for Advanced Analogue and RF Applications
Dirk B.M. KLAASSEN  Ronald van LANGEVELDE  Andries J. SCHOLTEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/06/01
Vol. E87-C  No. 6  pp. 854-866
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: INVITED
Keyword: 
compact modellingcompact modelsMOSFETRF performanceanalogue applicationsRF applicationsR2R circuitvariable transconductance circuit
  Summary |  Full Text:PDF

Mobility Reduction Cancellation Technique for OTA Using MOSFETs Operated in Triode and Saturation Regions
Hayato FUJII  Akira HYOGO  Keitaro SEKINE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/06/01
Vol. E87-C  No. 6  pp. 990-995
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: 
Keyword: 
MOSFETOTAmobility reductiontriode regionsaturation region
  Summary |  Full Text:PDF

A 380-MHz CMOS Linear-in-dB Variable Gain Amplifier with Gain Compensation Techniques for CDMA Systems
Osamu WATANABE  Mitsuyuki ASHIDA  Tetsuro ITAKURA  Shoji OTAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/06/01
Vol. E86-C  No. 6  pp. 1069-1076
Type of Manuscript: Special Section PAPER (Special Issue on Devices and Circuits for Next Generation Multi-Media Communication Systems)
Category: 
Keyword: 
variable gain amplifierVGAgain compensationtemperature compensationlinear-in-dB characteristicssquare circuitMOSFETsquare-law regionexponential-law regionCDMA
  Summary |  Full Text:PDF

Ensemble Monte Carlo/Molecular Dynamics Simulation of Inversion Layer Mobility in Si MOSFETs--Effects of Substrate Impurity
Yoshinari KAMAKURA  Hironori RYOUKE  Kenji TANIGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3  pp. 357-362
Type of Manuscript: Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category: 
Keyword: 
Monte Carlo simulationmolecular dynamicsmobilityscreeningMOSFET
  Summary |  Full Text:PDF

A Study of a Stable Driving Circuit for Arbitrary-Shaped Electroluminescent Elements
Yasuyuki KITADA  Noboru MASUDA  Hiroshi NAKANE  Sadao YAMAZAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/02/01
Vol. E86-A  No. 2  pp. 404-410
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
electroluminescent (EL) devicedriving circuitMOSFETtransformer
  Summary |  Full Text:PDF

Simulations of High-Frequency Thermal Noise in Silicon-on-Insulator MOSFETs Using Distributed-Transmission-Line Model
Daijiro SUMINO  Yasuhisa OMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/07/01
Vol. E85-C  No. 7  pp. 1443-1450
Type of Manuscript: Special Section PAPER (Special Issue on Silicon RF Device & Integrated Circuit Technologies)
Category: 
Keyword: 
thermal noisesilicon-on-insulatorMOSFETtransmission-line model
  Summary |  Full Text:PDF

Design and Simulation of 4Q-Multiplier Using Linear and Saturation Regions of MOSFET Complementally
Tsutomu SUZUKI  Takao OURA  Teru YONEYAMA  Hideki ASAI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/06/01
Vol. E85-A  No. 6  pp. 1242-1248
Type of Manuscript: Special Section PAPER (Special Section on Papers Selected from 2001 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2001))
Category: 
Keyword: 
4Q-MultiplierMOSFETlinear regionsaturation regionanalog circuit
  Summary |  Full Text:PDF

A New Test Structure for Precise Location Measurement of Hot-Carrier-Induced Photoemission Peak in Subquarter-Micron MOSFETs
Toshihiro MATSUDA  Mari FUNADA  Takashi OHZONE  Etsumasa KAMEDA  Shinji ODANAKA  Kyoji TAMASHITA  Norio KOIKE  Ken-ichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5  pp. 1125-1133
Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
test structureMOSFEThot carrierphotoemission
  Summary |  Full Text:PDF

Operational Transconductance Amplifier with Rail-to-Rail Input Stage Using Single Channel Type MOSFETs
Takahide SATO  Shigetaka TAKAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/02/01
Vol. E85-A  No. 2  pp. 354-359
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
rail-to-rail operationOTAMOSFEToperation region
  Summary |  Full Text:PDF

Power Consumption of Hybrid Circuits of Single-Electron Transistors and Complementary Metal-Oxide-Semiconductor Field-Effect Transistors
Ken UCHIDA  Junji KOGA  Ryuji OHBA  Akira TORIUMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/08/01
Vol. E84-C  No. 8  pp. 1066-1070
Type of Manuscript: Special Section PAPER (Special Issue on Silicon Nanodevices)
Category: 
Keyword: 
single-electrontunnelingMOSFETpower
  Summary |  Full Text:PDF

Scaling Limit of the MOS Transistor--A Ballistic MOSFET--
Kenji NATORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/08/01
Vol. E84-C  No. 8  pp. 1029-1036
Type of Manuscript: INVITED PAPER (Special Issue on Silicon Nanodevices)
Category: 
Keyword: 
ballistic MOSFETscaling limitcurrent-voltage characteristicsMOSFETinjection velocity
  Summary |  Full Text:PDF

MOSFET Instantaneous Companding Integrator
Nobukazu TAKAI  Ken-ichi TAKANO  Shigetaka TAKAGI  Nobuo FUJII 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/02/01
Vol. E84-A  No. 2  pp. 545-551
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques Supporting the System LSI Era)
Category: 
Keyword: 
MOSFETcompanding circuitintegrator
  Summary |  Full Text:PDF

Statistical Modeling of Device Characteristics with Systematic Variability
Kenichi OKADA  Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/02/01
Vol. E84-A  No. 2  pp. 529-536
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques Supporting the System LSI Era)
Category: 
Keyword: 
MOSFETvariabilitysystematicstochastic
  Summary |  Full Text:PDF

Low Power and Low Voltage MOSFETs with Variable Threshold Voltage Controlled by Back-Bias
Toshiro HIRAMOTO  Makoto TAKAMIYA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/02/20
Vol. E83-C  No. 2  pp. 161-169
Type of Manuscript: INVITED PAPER (Special Issue on Low-Power High-Speed CMOS LSI Technologies)
Category: 
Keyword: 
MOSFETlow powerlow voltagevariable threshold voltageback-biasbody effectDTMOSSOI
  Summary |  Full Text:PDF

Worst/Best Device and Circuit Performances for MOSFETs Determined from Process Fluctuations
Odin PRIGGE  Masami SUETAKE  Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/20
Vol. E82-C  No. 6  pp. 997-1002
Type of Manuscript: Special Section PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
MOSFETperformance distribution 2σanalytical model
  Summary |  Full Text:PDF

Inverse Modeling and Its Application to MOSFET Channel Profile Extraction
Hirokazu HAYASHI  Hideaki MATSUHASHI  Koichi FUKUDA  Kenji NISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/20
Vol. E82-C  No. 6  pp. 862-869
Type of Manuscript: INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
inverse modelingdoping profile extractionMOSFETthreshold voltage
  Summary |  Full Text:PDF

A Study on Hot-Carrier-Induced Photoemission in n-MOSFETs
Toshihiro MATSUDA  Naoko MATSUYAMA  Kiyomi HOSOI  Etsumasa KAMEDA  Takashi OHZONE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/20
Vol. E82-C  No. 4  pp. 593-601
Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
MOSFEThot carriersphotoemissionjunction breakdown
  Summary |  Full Text:PDF

A Study of Electrical Characteristics Improvements in Sub-0.1 µm Gate Length MOSFETs by Low Temperature Operation
Morikazu TSUNO  Shin YOKOYAMA  Kentaro SHIBAHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/12/20
Vol. E81-C  No. 12  pp. 1913-1917
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETlow temperaturevelocity overshootSbnonsteady-stationary effectimpact ionizationhot-carrier
  Summary |  Full Text:PDF

Simulated Device Design Optimization to Reduce the Floating Body Effect for Sub-Quarter Micron Fully Depleted SOI-MOSFETs
Risho KOH  Tohru MOGAMI  Haruo KATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/07/20
Vol. E80-C  No. 7  pp. 893-898
Type of Manuscript: Special Section PAPER (Special Issue on New Concept Device and Novel Architecture LSIs)
Category: Novel Structure Devices
Keyword: 
SOIMOSFETfloating body effectsimulationapplicable voltage
  Summary |  Full Text:PDF

Large-Signal Analysis of Power MOSFETs and Its Application to Device Design
Noriaki MATSUNO  Hitoshi YANO  Yasuyuki SUZUKI  Toshiaki INOUE  Tetsu TODA  Yasushi KOSE  Yoichiro TAKAYAMA  Kazuhiko HONJO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/06/20
Vol. E80-C  No. 6  pp. 734-739
Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeterwave High-power Devices)
Category: 
Keyword: 
power deviceMOSFETlarge-signal simulationcellular telephone
  Summary |  Full Text:PDF

Features of Ultimately Miniaturized MOSFETs/SOI: A New Stage in Device Physics and Design Concepts
Yasuhisa OMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/03/20
Vol. E80-C  No. 3  pp. 394-406
Type of Manuscript: INVITED PAPER (Special Issue on SOI Devices and Their Process Technologies)
Category: Device and Process Technologies
Keyword: 
SOISIMOXMOSFETdown-scalingultra-thin
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L-Band SPDT Switch Using Si-MOSFET
Yoshitada IYAMA  Noriharu SUEMATSU  Tomonori SHIGEMATSU  Takao MORIWAKI  Tatsuhiko IKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/05/20
Vol. E79-C  No. 5  pp. 636-643
Type of Manuscript: Special Section PAPER (Special Issue on Microwave Devices for Mobile Communications)
Category: Active Devices
Keyword: 
switchmicrowaveSiMOSFETcommunication
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Effects of Field Edge Steps on Electrical Gate Linewidth Measurements
Naoki KASAI  Ichiro YAMAMOTO  Koji URABE  Kuniaki KOYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/20
Vol. E79-C  No. 2  pp. 152-157
Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
test structureMOSFETlinewidthfield step
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Electrical Characteristics of n- and p-MOSFETs with Gates Crossing Source/Drain Regions at 90and 45
Takashi OHZONE  Naoko MATSUYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/20
Vol. E79-C  No. 2  pp. 172-178
Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
MOSFETelectrical characteristics45 CMOSFET
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High-Speed and Low-Power n+-p+ Double-Gate SOI CMOS
Kunihiro SUZUKI  Tetsu TANAKA  Yoshiharu TOSAKA  Hiroshi HORIE  Toshihiro SUGII 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/04/20
Vol. E78-C  No. 4  pp. 360-367
Type of Manuscript: Special Section PAPER (Special Issue on Low-Voltage, Low-Power Integrated Circuits)
Category: Device Technology
Keyword: 
MOSFETSOIdouble-gatehigh-speedlow-powerthreshold voltage
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A New Wide Applicable Mobility Model for Device Simulation Taking Physics-Based Carrier Screening Effects into Account
Koichi FUKUDA  Kenji NISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/20
Vol. E78-C  No. 3  pp. 281-287
Type of Manuscript: Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category: 
Keyword: 
device simulationmobilitycarrier screeningimpurity scatteringMOSFET
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Plasma-Induced Transconductance Degradation of nMOSFET with Thin Gate Oxide
Koji ERIGUCHI  Masatoshi ARAI  Yukiharu URAOKA  Masafumi KUBOTA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/20
Vol. E78-C  No. 3  pp. 261-266
Type of Manuscript: Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category: 
Keyword: 
MOSFETtransconductanceSi-SiO2 interface statecharge-to-breakdownantenna effect
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A Novel Effective-Channel-Length/External-Resistance Extraction Method for Small-Geometry MOSFET's
Takaaki YAGI  You-Wen YI  Mitsuchika SAITOH  Nobuo MIKOSHIBA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/12/20
Vol. E77-C  No. 12  pp. 1966-1969
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETeffective channel lengthsource-drain resistancelocal Vth
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Deep Submicron Field Isolation with Buried Insulator between Polysilicon Electrodes (BIPS)
Masahiro SHIMIZU  Masahide INUISHI  Katsuhiro TSUKAMOTO  Hideaki ARIMA  Hirokazu MIYOSHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/20
Vol. E77-C  No. 8  pp. 1369-1376
Type of Manuscript: Special Section PAPER (Special Section on High Speed and High Density Multi Functional LSI Memories)
Category: General Technology
Keyword: 
isolationparasitic field transistorMOSFET
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C-V and I-V Characteristics of a MOSFET with Si-Implanted Gate-SiO2
Takashi OHZONE  Takashi HORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/06/20
Vol. E77-C  No. 6  pp. 952-959
Type of Manuscript: PAPER
Category: Integrated Electronics
Keyword: 
MOSFETSi-implantationEEPROM
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LATID (Large-Angle-Tilt Implanted Drain) FETs with Buried n- Profile for Deep-Submicron ULSIs
Junji HIRASE  Takashi HORI  Yoshinori ODAKE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/20
Vol. E77-C  No. 3  pp. 350-354
Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
MOSFETLDDn--gate overlapcircuit speedhot-carrier-induced degradation
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Bi-MOSFET Amplifier for Integration with Multimicroelectrode Array for Extracellular Neuronal Recording
Kohro TAKAHASHI  Satoshi TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/02/20
Vol. E77-A  No. 2  pp. 388-393
Type of Manuscript: Special Section PAPER (Special Section on High-Performance MOS Analog Circuits)
Category: 
Keyword: 
MOSFET1/f noisemicroelectrodeextracellular recordinglow noise amplifier
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Two-Dimensional Modeling of Self-Aligned Silicide Processes with the General-Purpose Process Simulator OPUS
Kazuhiko KAI  Shigeki KURODA  Kenji NISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/20
Vol. E77-C  No. 2  pp. 129-133
Type of Manuscript: Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Process Simulation
Keyword: 
process simulationmodel for silicide growthSALICIDEsilicidationtitanium disilicideMOSFET
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Process and Device Technologies of CMOS Devices for Low-Voltage Operation
Masakazu KAKUMU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/05/20
Vol. E76-C  No. 5  pp. 672-680
Type of Manuscript: INVITED PAPER (Special Section on Low-Power and Low-Voltage Integrated Circuits)
Category: 
Keyword: 
CMOSSOISIMOXMOSFETlow-voltagelow-temperaturethreshold voltage high-speedpower-supply voltagesubthreshold currentcircuit performancepower dissipation
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Effects of Synchrotron X-Ray Irradiation on Hot Carrier Reliability in Subquarter-Micrometer NMOSFETs
Toshiaki TSUCHIYA  Mitsuru HARADA  Kimiyoshi DEGUCHI  Tadahito MATSUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/20
Vol. E76-C  No. 4  pp. 506-510
Type of Manuscript: INVITED PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
MOSFETreliabilityhot carriersynchrotron X-ray
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Multi-Step Function MOS Transistor Circuits
Shinji KARASAWA  Kazuhiko YAMANOUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/03/20
Vol. E76-C  No. 3  pp. 357-363
Type of Manuscript: INVITED PAPER (Special Issue on Multiple-Valued Integrated Circuits)
Category: 
Keyword: 
MOSFETpunch-through effectquantizing circuitmultiple-valued flip-flop
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Small-Signal High Frequency MOSFET Model Considering Two-Field-Dependent Mobility Effect
Laredj BELABAS  Nobuo FUJII  Shigetaka TAKAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/02/20
Vol. E76-A  No. 2  pp. 193-203
Type of Manuscript: Special Section PAPER (Special Section on High-Speed Analog Circuits and Signal Processing)
Category: 
Keyword: 
MOSFEThigh frequency modelmobility
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Effects of Hot Electron Trapping in Ultra-Thin-Film SOI/SIMOX pMOSFET's
Kazuo SUKEGAWA  Seiichiro KAWAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/12/20
Vol. E75-C  No. 12  pp. 1484-1490
Type of Manuscript: Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices)
Category: Hot Carrier
Keyword: 
SIMOXMOSFEThot carrier effectelectron trapping
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