Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2006/02/01 Vol. E89-ANo. 2pp. 465-468 Type of Manuscript: Special Section LETTER (Special Section on Analog Circuit Techniques and Related Topics) Category: Keyword: LSI testing,
analog circuit,
BIST,
equivalent-time sampling,
sampler,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3pp. 530-536 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Test Generation and Compaction Keyword: LSI testing,
sequential circuit,
test generation,
low power dissipation,
stuck-at fault,
