Keyword : IrO2


Improved Resistance Against the Reductive Ambient Annealing of Ferroelectric Pb(Zr, Ti)O3 Thin Film Capacitors with IrO2 Top Electrode
Yoshihisa FUJISAKI Keiko KUSHIDA-ABDELGHAFAR Hiroshi MIKI Yasuhiro SHIMAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 518-522
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
PZTIrO2ferroelectrichydrogencatalysis
 Summary | Full Text:PDF(497.1KB)

Effect of Zr/Ti Ratio on the Reliability Characteristics Behavior of Sol-Gel Derived PZT Films on Pt/IrO2 Electrode
Katsuyoshi MATSUURA Kazuaki TAKAI Tetsuro TAMURA Hiroshi ASHIDA Seigen OTANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 528-536
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
PZTsol-gelIrO2Zr/Ti ratioreliability
 Summary | Full Text:PDF(1.1MB)