Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/02/01 Vol. E96-DNo. 2pp. 303-313 Type of Manuscript: PAPER Category: Dependable Computing Keyword: IDDQ testing,
statistical leakage current analysis,
Bayes' theorem,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3pp. 537-543 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Test Generation and Compaction Keyword: IDDQ testing,
bridging faults,
switching current,
supply current test,
CMOS circuits,
An Analysis of the Relationship between IDDQ Testability and D-Type Flip-Flop Structure Yukiya MIURAHiroshi YAMAZAKI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/10/20 Vol. E81-DNo. 10pp. 1072-1078 Type of Manuscript: PAPER Category: Fault Tolerant Computing Keyword: IDDQ testing,
bridging faults,
flip-flops,
fault analysis,
An Iterative Improvement Method for Generating Compact Tests for IDDQ Testing of Bridging Faults Tsuyoshi SHINOGITerumine HAYASHI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/07/20 Vol. E81-DNo. 7pp. 682-688 Type of Manuscript: Special Section PAPER (Special Issue on Test and Diagnosis of VLSI) Category: IDDQ Testing Keyword: compaction,
IDDQ testing,
iterative improvement method,
bridging fault,
ATPG,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/07/20 Vol. E81-DNo. 7pp. 689-696 Type of Manuscript: Special Section PAPER (Special Issue on Test and Diagnosis of VLSI) Category: IDDQ Testing Keyword: sequential circuit,
test generation,
IDDQ testing,
bridging fault,
