Keyword : FinFET


Independent-Double-Gate FinFET SRAM Technology
Kazuhiko ENDO  Shin-ichi OUCHI  Takashi MATSUKAWA  Yongxun LIU  Meishoku MASAHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/04/01
Vol. E96-C  No. 4  pp. 413-423
Type of Manuscript: Special Section PAPER (Special Section on Solid-State Circuit Design—Architecture, Circuit, Device and Design Methodology)
Category: INVITED
Keyword: 
multi-gate devicesFinFETSRAMnoise margin
  Summary |  Full Text:PDF (2.9MB)

High-Frequency Precise Characterization of Intrinsic FinFET Channel
Hideo SAKAI  Shinichi O'UCHI  Takashi MATSUKAWA  Kazuhiko ENDO  Yongxun LIU  Junichi TSUKADA  Yuki ISHIKAWA  Tadashi NAKAGAWA  Toshihiro SEKIGAWA  Hanpei KOIKE  Kunihiro SAKAMOTO  Meishoku MASAHARA  Hiroki ISHIKURO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4  pp. 752-760
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
FinFETSOIDe-embeddingRFdevice modeling
  Summary |  Full Text:PDF (2.2MB)

Design of 30 nm FinFETs and Double Gate MOSFETs with Halo Structure
Tetsuo ENDOH  Koji SAKUI  Yukio YASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 534-539
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Multi-Gate Technology
Keyword: 
FinFEThalo I/IMOSFETthreshold voltage roll-offS-factor
  Summary |  Full Text:PDF (3.6MB)

Simulation Study on Dependence of Channel Potential Self-Boosting on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Devices
Seongjae CHO  Jung Hoon LEE  Yoon KIM  Jang-Gn YUN  Hyungcheol SHIN  Byung-Gook PARK 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 596-601
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Flash/Advanced Memory
Keyword: 
NANDflash memoryprogram inhibitionself-boostingFinFETdevice simulation
  Summary |  Full Text:PDF (1.2MB)

Adaptive Circuits for the 0.5-V Nanoscale CMOS Era
Kiyoo ITOH  Masanao YAMAOKA  Takashi OSHIMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C  No. 3  pp. 216-233
Type of Manuscript: Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: INVITED
Keyword: 
minimum operating voltageSRAMDRAMFD-SOIFinFET
  Summary |  Full Text:PDF (2.2MB)

FinFET-Based Flex-Vth SRAM Design for Drastic Standby-Leakage-Current Reduction
Shin-ichi O'UCHI  Meishoku MASAHARA  Kazuhiko ENDO  Yongxun LIU  Takashi MATSUKAWA  Kunihiro SAKAMOTO  Toshihiro SEKIGAWA  Hanpei KOIKE  Eiichi SUZUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4  pp. 534-542
Type of Manuscript: Special Section PAPER (Special Section on Advanced Technologies in Digital LSIs and Memories)
Category: 
Keyword: 
SRAMFinFET4T-FinFETstandby powerdynamic threshold-voltage control
  Summary |  Full Text:PDF (2.1MB)

Device Design of Nanoscale MOSFETs Considering the Suppression of Short Channel Effects and Characteristics Variations
Toshiro HIRAMOTO  Toshiharu NAGUMO  Tetsu OHTOU  Kouki YOKOYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C  No. 4  pp. 836-841
Type of Manuscript: Special Section PAPER (Special Section on Low-Power, High-Speed LSIs and Related Technologies)
Category: INVITED
Keyword: 
SOIbody factorbody effectFinFETmultigate MOSFET
  Summary |  Full Text:PDF (1.3MB)

Source/Drain Optimization of Double Gate FinFET Considering GIDL for Low Standby Power Devices
Katsuhiko TANAKA  Kiyoshi TAKEUCHI  Masami HANE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C  No. 4  pp. 842-847
Type of Manuscript: Special Section PAPER (Special Section on Low-Power, High-Speed LSIs and Related Technologies)
Category: Device
Keyword: 
FinFETdouble gateGIDLdevice simulationLSTP
  Summary |  Full Text:PDF (617.5KB)