Keyword : De-embedding

High-Frequency Precise Characterization of Intrinsic FinFET Channel
Hideo SAKAI  Shinichi O'UCHI  Takashi MATSUKAWA  Kazuhiko ENDO  Yongxun LIU  Junichi TSUKADA  Yuki ISHIKAWA  Tadashi NAKAGAWA  Toshihiro SEKIGAWA  Hanpei KOIKE  Kunihiro SAKAMOTO  Meishoku MASAHARA  Hiroki ISHIKURO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4  pp. 752-760
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
FinFET,  SOI,  De-embedding,  RF,  device modeling, 
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