Keyword : CMOS circuits

A 0.18 µm Stability-Enhanced CMOS LDO with Robust Compensation Scheme
Hsuan-I PAN  Chern-Lin CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/08/01
Vol. E92-C  No. 8  pp. 1080-1086
Type of Manuscript: PAPER
Category: Electronic Circuits
Keyword: 
CMOS circuits,  linear regulator,  compensation,  stability, 
  Summary |  Full Text:PDF
Ramp Voltage Testing for Detecting Interconnect Open Faults
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 700-705
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
CMOS circuits,  defect oriented testing,  open faults,  ramp voltage, 
  Summary |  Full Text:PDF
Test Sequence Generation for Test Time Reduction of IDDQ Testing
Hiroyuki YOTSUYANAGI  Masaki HASHIZUME  Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 537-543
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
IDDQ testing,  bridging faults,  switching current,  supply current test,  CMOS circuits, 
  Summary |  Full Text:PDF
Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field
Hiroyuki YOTSUYANAGI  Taisuke IWAKIRI  Masaki HASHIZUME  Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D  No. 12  pp. 2666-2673
Type of Manuscript: Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword: 
open defects,  supply current test,  CMOS circuits,  electric field, 
  Summary |  Full Text:PDF
A CMOS 310MHz, 20dB Variable Gain Amplifier
Khayrollah HADIDI  Abdollah KHOEI  Mahta JENABI  Hamed PEYRAVI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/05/01
Vol. E86-A  No. 5  pp. 1233-1239
Type of Manuscript: PAPER
Category: Analog Signal Processing
Keyword: 
VGA,  PGA,  adjustable gain,  amplifiers,  CMOS circuits, 
  Summary |  Full Text:PDF
An IDDQ Sensor Driven by Abnormal IDDQ
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/10/20
Vol. E83-D  No. 10  pp. 1860-1867
Type of Manuscript: PAPER
Category: Fault Tolerance
Keyword: 
built-in testing,  CMOS circuits,  IDDQ sensor circuits,  IDDQ testing,  low-voltage ICs, 
  Summary |  Full Text:PDF