Keyword : ATE

Introduction to Latest RF ATE with Low Test Cost Solutions
Masayuki KIMISHIMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/07/01
Vol. E95-C  No. 7  pp. 1147-1153
Type of Manuscript: Special Section PAPER (Special Section on Recent Trends of Microwave Systems and Their Fundamental Technologies)
Category: INVITED
Keyword: 
ATE,  SoC tester,  SIP,  calibration,  LTCC,  MMIC, 
  Summary |  Full Text:PDF
An Architecture of Embedded Decompressor with Reconfigurability for Test Compression
Hideyuki ICHIHARA  Tomoyuki SAIKI  Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 713-719
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Test Compression
Keyword: 
test compression,  ATE,  reconfigurability,  variable-length coding,  test application, 
  Summary |  Full Text:PDF
A Variable-Length Coding Adjustable for Compressed Test Application
Hideyuki ICHIHARA  Toshihiro OHARA  Michihiro SHINTANI  Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/08/01
Vol. E90-D  No. 8  pp. 1235-1242
Type of Manuscript: PAPER
Category: Dependable Computing
Keyword: 
test compression,  variable-length coding,  test application time,  ATE,  Huffman code,  and test environment, 
  Summary |  Full Text:PDF
Huffman-Based Test Response Coding
Hideyuki ICHIHARA  Michihiro SHINTANI  Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/01/01
Vol. E88-D  No. 1  pp. 158-161
Type of Manuscript: LETTER
Category: Dependable Computing
Keyword: 
Huffman code,  test compression,  test response,  test application time,  ATE, 
  Summary |  Full Text:PDF
A Hybrid Dictionary Test Data Compression for Multiscan-Based Designs
Youhua SHI  Shinji KIMURA  Masao YANAGISAWA  Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12  pp. 3193-3199
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
test data compression,  test slice,  multiple scan chain,  ATE, 
  Summary |  Full Text:PDF