Zhou JIANG


Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing
Zhou JIANG Guiming LUO Kele SHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/09/01
Vol. E99-C  No. 9  pp. 1071-1079
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
scan testscan segmentationlower power testingcomplex networks clusteringdesign for testabilityat-speed testing
 Summary | Full Text:PDF(731.4KB)

An Optimization Mechanism for Mid-Bond Testing of TSV-Based 3D SoCs
Kele SHEN Zhigang YU Zhou JIANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/02/01
Vol. E99-C  No. 2  pp. 308-315
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
core selectiontest timetest costoptimization3D SoC
 Summary | Full Text:PDF(597.2KB)