Analog Circuit Test Using Transfer Function Coefficient Estimates Zhen GUOJacob SAVIR
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3pp. 642-646 Type of Manuscript: Special Section LETTER (Special Section on Test and Verification of VLSI) Category: Keyword: fault detection,
parametric faults,
Monte-Carlo simulation,
system identification,