Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D
No. 10
pp. 1498-1505
Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: BIST
Keyword:
at-speed test,
BISR,
embedded DRAM,
test cost reduction,
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