Yuki TAKAHASHI


Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation
Kouji ICHIKAWA Yuki TAKAHASHI Yukihiko SAKURAI Takahiro TSUDA Isao IWASE Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/06/01
Vol. E91-C  No. 6  pp. 936-944
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
integrated circuitelectro magnetic interferenceon-chip monitorimmunity
 Summary | Full Text:PDF(1.5MB)

Experimental Verification of Power Supply Noise Modeling for EMI Analysis through On-Board and On-Chip Noise Measurements
Kouji ICHIKAWA Yuki TAKAHASHI Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/06/01
Vol. E90-C  No. 6  pp. 1282-1290
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
large scale integrationelectro magnetic interferenceprinted circuit boardsignal integritypower supply integrityintegrated analysis
 Summary | Full Text:PDF(2.3MB)