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Yuki SOH
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Ultra-Precision Measurement & Fabrication Technology of LSI and Its Materials for the Next Generation -- Toward the Atomic Scale Production Applying Novel Opt-Mechanical Methods -- Hiroshi KUBOTA
Yuki SOH
Seiya MATSUKAWA
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Publication: C - Abstracts of IEICE TRANSACTIONS on Electronics (Japanese Edition)
Publication Date: 2012/08/01
Vol. J95-C
No. 8
pp. 156-159
Type of Manuscript: Special Section PAPER (Special Issue on Expectations and Challenges of LSI and High-density Packaging Technology for Heterogeneous Device Integration)
Category: Keyword: next generation LSI,
mass-production,
atomic scale production,
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Summary |
Full Text(in Japanese):PDF
(619.2KB)
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