Yuji KUNITAKE


Short Term Cell-Flipping Technique for Mitigating SNM Degradation Due to NBTI
Yuji KUNITAKE Toshinori SATO Hiroto YASUURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4  pp. 520-529
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
NBTISRAMstatic noise marginstress probabilityregister filecache memory
 Summary | Full Text:PDF(1.2MB)

Enhancements of a Circuit-Level Timing Speculation Technique and Their Evaluations Using a Co-simulation Environment
Yuji KUNITAKE Kazuhiro MIMA Toshinori SATO Hiroto YASUURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 483-491
Type of Manuscript:  Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: 
Keyword: 
worst-case designtiming errorco-simulationparameter variation
 Summary | Full Text:PDF(820.5KB)