Yu-Ting HUANG


Design and Impact on ESD/LU Immunities by Drain-Side Super-Junction Structures in Low-(High-)Voltage MOSFETs for the Power Applications
Shen-Li CHEN Yu-Ting HUANG Shawn CHANG 
Publication:   
Publication Date: 2018/03/01
Vol. E101-C  No. 3  pp. 143-150
Type of Manuscript:  PAPER
Category: Electromagnetic Theory
Keyword: 
electrostatic discharge (ESD)holding voltage (Vh)n-channel lateral-diffused MOSFET (nLDMOS)secondary breakdown current (It2)super-junction (SJ)trigger voltage (Vt1)
 Summary | Full Text:PDF(1.4MB)

Design of High-ESD Reliability in HV Power pLDMOS Transistors by the Drain-Side Isolated SCRs
Shen-Li CHEN Yu-Ting HUANG Yi-Cih WU 
Publication:   
Publication Date: 2017/05/01
Vol. E100-C  No. 5  pp. 446-452
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
electrostatic discharge (ESD)holding voltage (Vh)P-channel lateral-diffused metal-oxide-semiconductor (pLDMOS)secondary breakdown current (It2)transmission-line pulse (TLP)trigger voltage (Vt1)
 Summary | Full Text:PDF(1.8MB)