Yoshiyasu TAKAHASHI


A Don't Care Filling Method for Low Capture Power based on Correlation of FF Transitions Using SAT
Masayoshi YOSHIMURA Yoshiyasu TAKAHASHI Hiroshi YAMAZAKI Toshinori HOSOKAWA 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12  pp. 2824-2833
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
transition faultscorrelationcapture power reductionX-fillingSAT
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