Yohei TAN

Background Self-Calibration Algorithm for Pipelined ADC Using Split ADC Scheme
Takuya YAGI  Kunihiko USUI  Tatsuji MATSUURA  Satoshi UEMORI  Satoshi ITO  Yohei TAN  Haruo KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/07/01
Vol. E94-C  No. 7  pp. 1233-1236
Type of Manuscript: BRIEF PAPER
Category: Electronic Circuits
Keyword: 
ADC,  self-calibration,  pipelined ADC,  split ADC,  digitally-assisted analog technology, 
  Summary |  Full Text:PDF
Design for Testability That Reduces Linearity Testing Time of SAR ADCs
Tomohiko OGAWA  Haruo KOBAYASHI  Satoshi UEMORI  Yohei TAN  Satoshi ITO  Nobukazu TAKAI  Takahiro J. YAMAGUCHI  Kiichi NIITSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6  pp. 1061-1064
Type of Manuscript: BRIEF PAPER
Category: 
Keyword: 
SAR ADC,  testing,  DC linearity,  design for testability,  built-in self-test, 
  Summary |  Full Text:PDF