Ying-Zu LIN

A Low-Cost Bit-Error-Rate BIST Circuit for High-Speed ADCs Based on Gray Coding
Ya-Ting SHYU  Ying-Zu LIN  Rong-Sing CHU  Guan-Ying HUANG  Soon-Jyh CHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/12/01
Vol. E95-A  No. 12  pp. 2415-2423
Type of Manuscript: PAPER
Category: Analog Signal Processing
Keyword: 
built-in self-test (BIST),  bit error rate (BER),  analog-to-digital converter (ADC), 
  Summary |  Full Text:PDF (2.5MB)
A 5-bit 4.2-GS/s Flash ADC in 0.13-µm CMOS Process
Ying-Zu LIN  Soon-Jyh CHANG  Yen-Ting LIU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/02/01
Vol. E92-C  No. 2  pp. 258-268
Type of Manuscript: PAPER
Category: Electronic Circuits
Keyword: 
flash A/D converter,  high-speed data converter,  interpolation,  resistive averaging network, 
  Summary |  Full Text:PDF (1MB)