Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/08/01 Vol. E86-CNo. 8pp. 1451-1457 Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology) Category: Keyword: maximum operating region,
measurement,
waveform,
power amplifier,
HBT,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/05/20 Vol. E79-CNo. 5pp. 650-656 Type of Manuscript: Special Section PAPER (Special Issue on Microwave Devices for Mobile Communications) Category: Active Devices Keyword: reflection type,
loaded-line type,
phase shifter,
phase state,
switching FET,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/09/20 Vol. E78-CNo. 9pp. 1229-1236 Type of Manuscript: Special Section PAPER (Special Issue on Ultra-High-Speed Electron Devices) Category: Keyword: calculation method,
amplifier,
MMIC,
high efficiency,
high power,
low-voltage,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/09/20 Vol. E78-CNo. 9pp. 1210-1215 Type of Manuscript: Special Section PAPER (Special Issue on Ultra-High-Speed Electron Devices) Category: Keyword: amplifier,
low noise,
MMIC,
millimeter-wave,
HEMT,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/09/20 Vol. E78-CNo. 9pp. 1252-1254 Type of Manuscript: Special Section LETTER (Special Issue on Ultra-High-Speed Electron Devices) Category: Keyword: amplifier,
power,
wideband,
monolithic,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/08/20 Vol. E78-CNo. 8pp. 936-943 Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology) Category: Keyword: amplifier,
high power,
instability,
loop oscillation,
analysis,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/20 Vol. E77-ANo. 1pp. 158-165 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: Failure Physics and Failure Analysis Keyword: T-Shaped gate HEMT,
von Mises stress,
recess depth,
stress concentration,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/06/20 Vol. E76-CNo. 6pp. 891-900 Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functions and Size-Reductions) Category: Keyword: FIB (Focused Ion Beam),
trimming,
circuit optimization,
MMIC,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/10/20 Vol. E75-CNo. 10pp. 1146-1153 Type of Manuscript: Special Section PAPER (Special Issue on Compound Semiconductor Integrated Circuits) Category: Keyword: air-bridge,
interconnection,
propagation delay time,
GaAs LSI,
