Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-CNo. 5pp. 851-856 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures) Category: Keyword: 4-port,
RF MOSFET,
common source,
common gate,
common drain,
substrate bias,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/05/01 Vol. E87-CNo. 5pp. 720-725 Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits) Category: Active Devices and Circuits Keyword: high-frequency,
SiGe,
heterojunction bipolar transistor,
pulsed measurement,
self-heating effect,
