Tomohiko OGAWA


Design for Testability That Reduces Linearity Testing Time of SAR ADCs
Tomohiko OGAWA Haruo KOBAYASHI Satoshi UEMORI Yohei TAN Satoshi ITO Nobukazu TAKAI Takahiro J. YAMAGUCHI Kiichi NIITSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6  pp. 1061-1064
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
SAR ADCtestingDC linearitydesign for testabilitybuilt-in self-test
 Summary | Full Text:PDF(462.8KB)

SAR ADC Algorithm with Redundancy and Digital Error Correction
Tomohiko OGAWA Haruo KOBAYASHI Yosuke TAKAHASHI Nobukazu TAKAI Masao HOTTA Hao SAN Tatsuji MATSUURA Akira ABE Katsuyoshi YAGI Toshihiko MORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/02/01
Vol. E93-A  No. 2  pp. 415-423
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
SAR ADCdigital error correctionnon-binaryredundancy
 Summary | Full Text:PDF(632.9KB)