Tamiyo NAKABAYASHI


Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation
Toshiki KANAMOTO  Shigekiyo AKUTSU  Tamiyo NAKABAYASHI  Takahiro ICHINOMIYA  Koutaro HACHIYA  Atsushi KUROKAWA  Hiroshi ISHIKAWA  Sakae MUROMOTO  Hiroyuki KOBAYASHI  Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/12/01
Vol. E89-A  No. 12  pp. 3666-3670
Type of Manuscript: Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category: Interconnect
Keyword: 
interconnectdelay variationparasitic capacitanceSoC
  Summary |  Full Text:PDF (434.3KB)