IEICE SEARCH SYSTEM

Takuji OKAMOTO

Detection of CMOS Open Node Defects by Frequency Analysis Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/03/01 Vol. E90-D No. 3 pp. 685-687 Type of Manuscript: LETTER Category: Dependable Computing Keyword: current test, open node defect, floating gate defect, frequency analysis,
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CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-D No. 3 pp. 551-556 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Fault Detection Keyword: current test, floating gate defect, open defect, defect detection,
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Testing for the Programming Circuit of SRAM-Based FPGAs Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Tomoo INOUE Hideo FUJIWARA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1999/06/20 Vol. E82-D No. 6 pp. 1051-1057 Type of Manuscript: PAPER Category: Fault Tolerant Computing Keyword: fault detection, LUT-based FPGA, SRAM-based FPGA, functional fault, configuration,
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The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs Tokumi YOKOHIRA Toshimi SHIMIZU Hiroyuki MICHINISHI Yuji SUGIYAMA Takuji OKAMOTO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1995/07/20 Vol. E78-D No. 7 pp. 874-881 Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems) Category: Keyword: built-in self-test, exhaustive testing, test pattern generation, minimum test set, dependence matrix,
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Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1993/07/20 Vol. E76-D No. 7 pp. 791-799 Type of Manuscript: Special Section PAPER (Special Issue on VLSI Testing and Testable Design) Category: Keyword: built-in-self-test, pseudoexhaustive testing, verification testing, locally exhaustive testing, test pattern generation,
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An Algebraic Specification of a Daisy Chain Arbiter Yu Rong HOU Atsushi OHNISHI Yuji SUGIYAMA Takuji OKAMOTO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1992/11/20 Vol. E75-D No. 6 pp. 778-784 Type of Manuscript: Special Section PAPER (Special Issue on Pacific Rim International Symposium on Fault Tolerant Systems) Category: Keyword: specification, algebraic method, asynchronous circuits, arbiter,
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Test Set for a Multibit Shifter Constructed with Multiplexers Tokumi YOKOHIRA Hiroyuki MICHINISHI Takuji OKAMOTO Yuji SUGIYAMA
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1990/08/20 Vol. E73-E No. 8 pp. 1301-1309 Type of Manuscript: Special Section PAPER (Special Issue on Fault-Tolerant Systems) Category: Keyword:
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