Takanori KOMURO


A Practical Analog BIST Cooperated with an LSI Tester
Takanori KOMURO Naoto HAYASAKA Haruo KOBAYASHI Hiroshi SAKAYORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/02/01
Vol. E89-A  No. 2  pp. 465-468
Type of Manuscript:  Special Section LETTER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
LSI testinganalog circuitBISTequivalent-time samplingsampler
 Summary | Full Text:PDF(165.7KB)

Reducing Spurious Output of Balanced Modulators by Dynamic Matching of I, Q Quadrature Paths
Jun OTSUKI Hao SAN Haruo KOBAYASHI Takanori KOMURO Yoshihisa YAMADA Aiyan LIU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/06/01
Vol. E88-C  No. 6  pp. 1290-1294
Type of Manuscript:  Special Section LETTER (Special Section on Analog Circuit and Device Technologies)
Category: AD/DA
Keyword: 
Cartesian transmitterarbitrary waveform generatorIQ mismatchSFDRspread spectrum
 Summary | Full Text:PDF(600.7KB)

Algorithms for Digital Correction of ADC Nonlinearity
Haruo KOBAYASHI Hiroshi YAGI Takanori KOMURO Hiroshi SAKAYORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/02/01
Vol. E86-A  No. 2  pp. 504-508
Type of Manuscript:  LETTER
Category: Analog Signal Processing
Keyword: 
ADCnonlinearitydigital error correctiondigital signal processingLSI tester
 Summary | Full Text:PDF(242.9KB)