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Takahiro J. YAMAGUCHI
Design for Testability That Reduces Linearity Testing Time of SAR ADCs
Tomohiko OGAWA
Haruo KOBAYASHI
Satoshi UEMORI
Yohei TAN
Satoshi ITO
Nobukazu TAKAI
Takahiro J. YAMAGUCHI
Kiichi NIITSU
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
2011/06/01
Vol.
E94-C
No.
6
pp.
1061-1064
Type of Manuscript:
BRIEF PAPER
Category:
Keyword:
SAR ADC
,
testing
,
DC linearity
,
design for testability
,
built-in self-test
,
Summary
|
Full Text:PDF
