Sungho KANG


Built-In Self-Test for Static ADC Testing with a Triangle-Wave
Incheol KIM Ingeol LEE Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/02/01
Vol. E96-C  No. 2  pp. 292-294
Type of Manuscript:  BRIEF PAPER
Category: Integrated Electronics
Keyword: 
ADCBISTstatic testtriangle-wave
 Summary | Full Text:PDF(577.1KB)

Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter
Hyejeong HONG Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2013/02/01
Vol. E96-B  No. 2  pp. 643-646
Type of Manuscript:  LETTER
Category: Internet
Keyword: 
computer network securitydeep packet inspectionand string matching
 Summary | Full Text:PDF(229.6KB)

An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector
Hyuntae PARK Hyejeong HONG Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2011/11/01
Vol. E94-B  No. 11  pp. 3128-3131
Type of Manuscript:  LETTER
Category: Network System
Keyword: 
IP address lookupbalanced binary searchminimal entryoptimal prefix vector
 Summary | Full Text:PDF(158.3KB)

Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach
Hyeonuk SON Incheol KIM Sang-Goog LEE Jin-Ho AHN Jeong-Do KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/08/01
Vol. E94-C  No. 8  pp. 1344-1347
Type of Manuscript:  LETTER
Category: Electronic Circuits
Keyword: 
digital-to-analogue converter (DAC)built-in self-test (BIST)noise-immunitystatic testing
 Summary | Full Text:PDF(573.2KB)

A Hardware-Efficient Pattern Matching Architecture Using Process Element Tree for Deep Packet Inspection
Seongyong AHN Hyejeong HONG HyunJin KIM Jin-Ho AHN Dongmyong BAEK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/09/01
Vol. E93-B  No. 9  pp. 2440-2442
Type of Manuscript:  LETTER
Category: Network Management/Operation
Keyword: 
network intrusion detection systemdeep packet inspectionpattern matchingbrute-force algorithm
 Summary | Full Text:PDF(123.3KB)

A Pattern Partitioning Algorithm for Memory-Efficient Parallel String Matching in Deep Packet Inspection
HyunJin KIM Hyejeong HONG Dongmyoung BAEK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/06/01
Vol. E93-B  No. 6  pp. 1612-1614
Type of Manuscript:  LETTER
Category: Network Management/Operation
Keyword: 
computer network securitydeep packet inspectionfinite state machinepattern matchingand network monitoring
 Summary | Full Text:PDF(6.7MB)

A Fast IP Address Lookup Algorithm Based on Search Space Reduction
Hyuntae PARK Hyunjin KIM Hong-Sik KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/04/01
Vol. E93-B  No. 4  pp. 1009-1012
Type of Manuscript:  LETTER
Category: Switching for Communications
Keyword: 
IP address lookupsearch space reductionpartitioning
 Summary | Full Text:PDF(230.6KB)

Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
Youbean KIM Jaewon JANG Hyunwook SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/03/01
Vol. E93-D  No. 3  pp. 643-646
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
BISTlow power BISTdesign for testability
 Summary | Full Text:PDF(293.9KB)

Selective Scan Slice Grouping Technique for Efficient Test Data Compression
Yongjoon KIM Jaeseok PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/02/01
Vol. E93-D  No. 2  pp. 380-383
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT)scan testingSoC testtest data compression
 Summary | Full Text:PDF(122.9KB)

A Memory-Efficient Pattern Matching with Hardware-Based Bit-Split String Matchers for Deep Packet Inspection
HyunJin KIM Hong-Sik KIM Jung-Hee LEE Jin-Ho AHN Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/02/01
Vol. E93-B  No. 2  pp. 396-398
Type of Manuscript:  LETTER
Category: Network Management/Operation
Keyword: 
computer network securitydeep packet inspectionfinite state machinepattern matchingand network monitoring
 Summary | Full Text:PDF(269KB)

A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
Yongjoon KIM Jaeseok PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1  pp. 193-196
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT)scan testingscan cell reorderinglow power test
 Summary | Full Text:PDF(140.5KB)

An Effective Programmable Memory BIST for Embedded Memory
Youngkyu PARK Jaeseok PARK Taewoo HAN Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/12/01
Vol. E92-D  No. 12  pp. 2508-2511
Type of Manuscript:  LETTER
Category: Computer Components
Keyword: 
Programmable BISTtest algorithmmulti-loop
 Summary | Full Text:PDF(630.8KB)

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
Yongjoon KIM Myung-Hoon YANG Jaeseok PARK Eunsei PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/07/01
Vol. E92-D  No. 7  pp. 1462-1465
Type of Manuscript:  LETTER
Category: VLSI Systems
Keyword: 
design for testability (DfT)scan testingtest data compression
 Summary | Full Text:PDF(887.3KB)

A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals
Youbean KIM Kicheol KIM Incheol KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/10/01
Vol. E91-C  No. 10  pp. 1713-1716
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
mixed-signal testPLL (phase-locked loops)BIST (built-in self test)DFT (design for testability)
 Summary | Full Text:PDF(489.5KB)

A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
Youbean KIM Kicheol KIM Incheol KIM Hyunwook SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4  pp. 1185-1188
Type of Manuscript:  LETTER
Category: Computer Components
Keyword: 
low power BIST (Built-in Self Test)pseudo-random BISTlow power pattern generator
 Summary | Full Text:PDF(589.9KB)

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
Kicheol KIM Youbean KIM Incheol KIM Hyeonuk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4  pp. 670-672
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
ADC testingBISThistogram testing
 Summary | Full Text:PDF(363.5KB)

MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs
Dong-Sup SONG Jin-Ho AHN Tae-Jin KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4  pp. 1197-1200
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
low power testscan-based testX-fillingtest application time
 Summary | Full Text:PDF(538.3KB)

A New Analog-to-Digital Converter BIST Considering a Transient Zone
Incheol KIM Kicheol KIM Youbean KIM HyeonUk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/11/01
Vol. E90-C  No. 11  pp. 2161-2163
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
static ADC built-in self-testtransient zone problem
 Summary | Full Text:PDF(409.8KB)

A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets
Dong-Sup SONG Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/01/01
Vol. E89-D  No. 1  pp. 354-357
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
deterministic logic BISTembedded core testing
 Summary | Full Text:PDF(587.3KB)

A New Low Power Test Pattern Generator for BIST Architecture
Kicheol KIM Dongsub SONG Incheol KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/10/01
Vol. E88-C  No. 10  pp. 2037-2038
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
low power BISTlow power test pattern generator
 Summary | Full Text:PDF(279.9KB)

An Effective Built-In Self-Test for Chargepump PLL
Junseok HAN Dongsup SONG Hagbae KIM YoungYong KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/08/01
Vol. E88-C  No. 8  pp. 1731-1733
Type of Manuscript:  Special Section LETTER (Special Section on Papers Selected from AP-ASIC 2004)
Category: 
Keyword: 
mixed-signal testBISTPLL
 Summary | Full Text:PDF(559.7KB)

An Acceleration Processor for Data Intensive Scientific Computing
Cheong Ghil KIM Hong-Sik KIM Sungho KANG Shin Dug KIM Gunhee HAN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/07/01
Vol. E87-D  No. 7  pp. 1766-1773
Type of Manuscript:  Special Section PAPER (Special Section on Hardware/Software Support for High Performance Scientific and Engineering Computing)
Category: Scientific and Engineering Computing with Applications
Keyword: 
SIMDFPGAartificial neural networksdiffusion equationsimage processing
 Summary | Full Text:PDF(1.1MB)

A Low-Power Implementation Scheme of Interpolation FIR Filters Using Distributed Arithmetic
Sangyun HWANG Gunhee HAN Sungho KANG Jaeseok KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/11/01
Vol. E86-C  No. 11  pp. 2346-2350
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
low-power interpolation FIR filterdistributed arithmeticlook-up tabledynamic power consumption
 Summary | Full Text:PDF(531.2KB)

A DFT Controller for Instruction-Based Functional Test
Hong-Sik KIM Yong-Chun KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/08/01
Vol. E84-A  No. 8  pp. 2070-2072
Type of Manuscript:  LETTER
Category: VLSI Design Technology and CAD
Keyword: 
functional testscan
 Summary | Full Text:PDF(258.9KB)

Efficient Test Generation Using Redundancy Identification
Sangyoon HAN Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/09/25
Vol. E83-D  No. 9  pp. 1814-1815
Type of Manuscript:  LETTER
Category: Fault Tolerance
Keyword: 
test pattern generationredundant faults
 Summary | Full Text:PDF(108.2KB)