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Suehiro SUGITANI
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Analysis of Passivation-Film-Induced Stress Effects on Electrical Properties in AlGaN/GaN HEMTs Naoteru SHIGEKAWA
Suehiro SUGITANI
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Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2010/08/01
Vol. E93-C
No. 8
pp. 1212-1217
Type of Manuscript: Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM 2009)
Category: GaN-based Devices Keyword: GaN,
HEMT,
threshold voltage,
piezoelectric effects,
film stress,
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