Song BIAN


Identification and Application of Invariant Critical Paths under NBTI Degradation
Song BIAN Shumpei MORITA Michihiro SHINTANI Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12  pp. 2797-2806
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
NBTIaging effectinvariant critical pathprocessor
 Summary | Full Text:PDF(1.3MB)

Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation
Shumpei MORITA Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/07/01
Vol. E100-A  No. 7  pp. 1464-1472
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTI mitigationreliabilitytransistor agingperformance degradationinternal node control
 Summary | Full Text:PDF(936.4KB)

Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability
Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7  pp. 1400-1409
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTIreliabilitystatic timing analysistiming characterizationaging-aware timing library
 Summary | Full Text:PDF(1017.4KB)