Shyh-Shyuan SHEU

A 50 ns Verify Speed in Resistive Random Access Memory by Using a Write Resistance Tracking Circuit
Shyh-Shyuan SHEU  Kuo-Hsing CHENG  Yu-Sheng CHEN  Pang-Shiu CHEN  Ming-Jinn TSAI  Yu-Lung LO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/06/01
Vol. E95-C  No. 6  pp. 1128-1131
Type of Manuscript: BRIEF PAPER
Category: Integrated Electronics
Keyword: 
Resistive RAM (RRAM),  verify,  write resistance tracking circuit, 
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