Shigeru ITO


On Fault Testing for Reversible Circuits
Satoshi TAYU Shigeru ITO Shuichi UENO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/12/01
Vol. E91-D  No. 12  pp. 2770-2775
Type of Manuscript:  PAPER
Category: Complexity Theory
Keyword: 
3-SATCNOT gatecomplete test setfault testingNP-completereversible circuitstuck-at faulttest vector
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