Sheng-Yu WEN


An Accurate and Low-Cost Method for On-Wafer LNA Noise Figure Measurement
Sheng-Yu WEN Guo-Wei HUANG Kun-Ming CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 742-748
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
on-wafernoise figure measurementlow-noise amplifier
 Summary | Full Text:PDF(1.1MB)