Seichi OKAMURA

A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique
Zhihong MA  Seichi OKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/12/20
Vol. E81-C  No. 12  pp. 1936-1941
Type of Manuscript: PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
microwave,  permittivity,  measurement,  non-reflection,  on-line,  free-space technique, 
  Summary |  Full Text:PDF (491.6KB)
Analysis and Elimination of the Reflection lnfluence on Microwave Attenuation Measurement for Moisture Determination
Zhihong MA  Seichi OKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/10/20
Vol. E80-C  No. 10  pp. 1324-1329
Type of Manuscript: PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
microwave,  attenuation,  reflection,  moisture content,  density,  propagation distance, 
  Summary |  Full Text:PDF (526.4KB)