Seaung Suk LEE


Estimation of Imprint Failure Lifetime in FeRAM with Pt/SrBi2Ta2O9/Pt Capacitor
Young Min KANG  Seaung Suk LEE  Beelyong YANG  Choong Heui CHUNG  Hun Woo KYE  Suk Kyoung HONG  Nam Soo KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/06/01
Vol. E84-C  No. 6  pp. 757-762
Type of Manuscript: Special Section PAPER (Special Issue on Nonvolatile Memories)
Category: FeRAMs
Keyword: 
ferroelectricnonvolatilememoryFeRAMimprintreliability
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