Ryuji OHMURA

Accomplishment of At-Speed BISR for Embedded DRAMs
Yoshihiro NAGURA  Yoshinori FUJIWARA  Katsuya FURUE  Ryuji OHMURA  Tatsunori KOMOIKE  Takenori OKITAKA  Tetsushi TANIZAKI  Katsumi DOSAKA  Kazutami ARIMOTO  Yukiyoshi KODA  Tetsuo TADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1498-1505
Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: BIST
Keyword: 
at-speed test,  BISR,  embedded DRAM,  test cost reduction, 
  Summary |  Full Text:PDF (2.2MB)
A Practical Test System with a Fuzzy Logic Controller
Takeshi KOYAMA  Ryuji OHMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/20
Vol. E78-D  No. 7  pp. 868-873
Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
fuzzy test system,  adaptive control,  stable quality assurance,  stability condition, 
  Summary |  Full Text:PDF (428.9KB)