Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2011/09/01 Vol. E94-CNo. 9pp. 1375-1380 Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices – Papers selected from International Session on Electro-Mechanical Devices (IS-EMD2010) and other research results –) Category: Keyword: sealed relay,
failure process,
time parameter,
gap time,
dynamic reliability estimation,
The Discrimination of Contact Failure Mechanisms by Analyzing the Variations of Time Parameters for Relays Shujuan WANGQiong YUGuofu ZHAI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2010/09/01 Vol. E93-CNo. 9pp. 1437-1442 Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices (Selected Papers from IS-EMD2009)) Category: Keyword: relays,
time parameters,
life test,
contact failure mechanism,
contact failure process,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/08/01 Vol. E92-CNo. 8pp. 1034-1039 Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices (IS-EMD2008)) Category: Relacys & Switches Keyword: relays,
accelerated life test,
load current stress,
failure mechanism,
failure model,
