Nobutaka KITO


Floating-Point Multiplier with Concurrent Error Detection Capability by Partial Duplication
Nobutaka KITO Kazushi AKIMOTO Naofumi TAKAGI 
Publication:   
Publication Date: 2017/03/01
Vol. E100-D  No. 3  pp. 531-536
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
concurrent error detectionfloating-point multiplierduplicationtruncated multiplier
 Summary | Full Text:PDF(512.4KB)

Circuit Description and Design Flow of Superconducting SFQ Logic Circuits
Kazuyoshi TAKAGI Nobutaka KITO Naofumi TAKAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/03/01
Vol. E97-C  No. 3  pp. 149-156
Type of Manuscript:  INVITED PAPER (Special Section on Leading-Edge Technology of Superconductor Large-Scale Integrated Circuits)
Category: 
Keyword: 
single-flux-quantum circuitdesign methodologycircuit descriptionlogic designlayout designdesign verification
 Summary | Full Text:PDF(2.8MB)

Low-Overhead Fault-Secure Parallel Prefix Adder by Carry-Bit Duplication
Nobutaka KITO Naofumi TAKAGI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9  pp. 1962-1970
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
parity predictionparallel prefix adderfault securecarry-bit duplication
 Summary | Full Text:PDF(968.9KB)

A C-Testable Multiple-Block Carry Select Adder
Nobutaka KITO Shinichi FUJII Naofumi TAKAGI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/04/01
Vol. E95-D  No. 4  pp. 1084-1092
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
carry select adderdesign for testabilityC-testability
 Summary | Full Text:PDF(311.2KB)

A C-Testable 4-2 Adder Tree for an Easily Testable High-Speed Multiplier
Nobutaka KITO Kensuke HANAI Naofumi TAKAGI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/10/01
Vol. E93-D  No. 10  pp. 2783-2791
Type of Manuscript:  PAPER
Category: Information Network
Keyword: 
multiplierdesign for testability4-2 adder treeC-testability
 Summary | Full Text:PDF(381.2KB)