Nobukage IUCHI


A Method of Generating Tests for Combinational Circuits with Multiple Faults
Hiroshi TAKAHASHI Nobukage IUCHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1992/07/25
Vol. E75-D  No. 4  pp. 569-576
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
multiple faultscombinational circuitstest generationrobust tests
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